Proposed Method of Measurement for Appearance of Rolled Aluminum Surfaces Using Distinctness of Image and Diffuse Reflectance Measuring Instruments

2009 ◽  
pp. 79-79-7
Author(s):  
B. W. Robinson
1974 ◽  
Vol 54 (3) ◽  
pp. 505-509 ◽  
Author(s):  
J. D. MACNEIL ◽  
R. S. DOWNING ◽  
M. HIKICHI

Diffuse reflectance spectroscopy measured damage to leaves of McIntosh, Red Delicious and Golden Delicious apple (Malus sylvestrus Mill.) trees caused by varying population levels of the European red mite, Panonychus ulmi (Koch). The ratio of yellow pigment to green pigment in the leaves increased with increasing mite populations. Results were compared with those obtained by chlorophyll analyses. Transpiration burn injury was found to obscure such relationships, if they exist, on Bartlett pear (Pyrus communis L.) leaves on which mites had been feeding. The results indicate that reflectance spectroscopy will measure damage caused by leaf-feeding mites and is a more rapid and sensitive method of measurement than the analysis of chlorophyll in solution.


2001 ◽  
Vol 40 (13) ◽  
pp. 2148 ◽  
Author(s):  
Mats Rönnelid ◽  
Monika Adsten ◽  
Tomas Lindström ◽  
Per Nostell ◽  
Ewa Wäckelgård

1992 ◽  
Vol 17 (2) ◽  
pp. 103-109 ◽  
Author(s):  
R. Silvennoinen ◽  
K.-E. Peiponen ◽  
T. Asakura ◽  
Yan-Fang Zhang ◽  
Cong Gu ◽  
...  

2001 ◽  
Vol 187 (4-6) ◽  
pp. 289-294 ◽  
Author(s):  
Damien Vandembroucq ◽  
Annie Tarrats ◽  
Jean-Jacques Greffet ◽  
Stéphane Roux ◽  
Franck Plouraboué

1996 ◽  
Vol 74 (5-6) ◽  
pp. 244-250 ◽  
Author(s):  
A. D. O. Bawagan ◽  
M. Sabaye-Moghaddam ◽  
K. H. Tan ◽  
B. W. Yates

Changes in color of coated (painted) aluminum surfaces exposed to broad-band synchrotron radiation (10–2000 eV) are investigated as a function of radiation dose (N). Quantitative color differences [Formula: see text] before and after exposure are obtained from spectral diffuse reflectance measurements using the standard CIELAB formula. The results indicate that the dose–response curve of the color-coated surfaces at large photon doses can be described as [Formula: see text] where d is a material-dependent constant.


1978 ◽  
Vol 48 ◽  
pp. 271-278
Author(s):  
Chr. Kühne

The PZT according to MARKOWITZ, undoubtedly one of the most accurate measuring instruments, has become an integral part of astronomy in the last years. Yet there are two reasons why I still tried to improve the MARKOWITZ basic idea.For the MARKOWITZ process the use of a lens objective is imperative. Because of the diameter limitations of the lens objectives the magnitude is reduced. Although a 65 cm PZT has been put into operation in Washington recently, the thermal difficulties encountered made it necessary to control the temperature actively. In addition, the 65 cm diameter of a lens equipped with 4 elements can be considered as the very limit, but not for a mirror system.In addition there are still more disadvantages using lens objectives. The useable field is restricted by astigmatism, reducing the range of declination. The transmission, especially in the blue wavelengths, decreases very rapidly with the thickness of lenses. For large multilens objectives the transmission is less than for a mirror system.


Metrologiya ◽  
2020 ◽  
pp. 3-15
Author(s):  
Rustam Z. Khayrullin ◽  
Alexey S. Kornev ◽  
Andrew A. Kostoglotov ◽  
Sergey V. Lazarenko

Analytical and computer models of false failure and undetected failure (error functions) were developed with tolerance control of the parameters of the components of the measuring technique. A geometric interpretation of the error functions as two-dimensional surfaces is given, which depend on the tolerance on the controlled parameter and the measurement error. The developed models are applicable both to theoretical laws of distribution, and to arbitrary laws of distribution of the measured quantity and measurement error. The results can be used in the development of metrological support of measuring equipment, the verification of measuring instruments, the metrological examination of technical documentation and the certification of measurement methods.


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