Specular and Diffuse Reflectance Measurements of Aluminum Surfaces

2009 ◽  
pp. 46-46-13
Author(s):  
E. F. Barkman
1996 ◽  
Vol 74 (5-6) ◽  
pp. 244-250 ◽  
Author(s):  
A. D. O. Bawagan ◽  
M. Sabaye-Moghaddam ◽  
K. H. Tan ◽  
B. W. Yates

Changes in color of coated (painted) aluminum surfaces exposed to broad-band synchrotron radiation (10–2000 eV) are investigated as a function of radiation dose (N). Quantitative color differences [Formula: see text] before and after exposure are obtained from spectral diffuse reflectance measurements using the standard CIELAB formula. The results indicate that the dose–response curve of the color-coated surfaces at large photon doses can be described as [Formula: see text] where d is a material-dependent constant.


2002 ◽  
Vol 4 (1) ◽  
pp. 21-26 ◽  
Author(s):  
Frank Schael ◽  
Oliver Reich ◽  
Sonja Engelhard

Diffuse reflectance measurements and photon migration studies with near infrared (NIR) diode lasers were employed to elucidate experimental methods for determining absorption and scattering coefficients and species concentrations in heterogenous media. Measurements were performed at a number of wavelengths utilizing several laser sources some of which were widely tunable. In order to establish the applicability of simple photon migration models derived from radiation transport theory and to check the experimental boundary conditions of our measurements, simple light scattering solutions (such as suspensions of titanium dioxide, latex particles, and solutions of milk powder) containing dyes (such as nile blue, isosulfan blue) were investigated. The results obtained from diffuse-reflectance studies at different sourcedetector distances were in accordance with predictions from simple photon diffusion theory. Applications of reflectance measurements for monitoring of cell growth during fermentation processes and forin-situinvestigations of soils are presented.


2021 ◽  
pp. 114573
Author(s):  
Salmon Landi ◽  
Iran Rocha Segundo ◽  
Elisabete Freitas ◽  
Mikhail Vasilevskiy ◽  
Joaquim Carneiro ◽  
...  

2013 ◽  
Vol 21 (26) ◽  
pp. 32630 ◽  
Author(s):  
Rodrigo Watté ◽  
Nghia Nguyen Do Trong ◽  
Ben Aernouts ◽  
Chyngyz Erkinbaev ◽  
Josse De Baerdemaeker ◽  
...  

1989 ◽  
Vol 43 (2) ◽  
pp. 267-274 ◽  
Author(s):  
D. M. Hembree ◽  
H. R. Smyrl

In this report, the two most common diffuse reflectance infrared Fourier transform spectroscopy (DRIFTS) optical geometries (on-axis and off-axis) are investigated in terms of adherence to the Kubelka-Munk theory. It was found that specular reflection, whether in the form of regular Fresnel reflection or diffuse Fresnel reflection, is the major cause of spectral distortion in typical diffuse reflectance measurements. A discussion of the origin of the variation in specular background associated with resonances is presented. Once the adverse effects of specular reflection are minimized, the linear relationship between response and concentration predicted by Kubelka-Munk theory was found to extend to concentrated samples. Up to a point, this was the case even for intense absorption bands where anomalous dispersion leads to large changes in specular intensity.


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