scholarly journals THE EFFECT OF SENSOR MASS, SENSOR LOCATION, AND DELAMINATION LOCATION OF DIFFERENT COMPOSITE STRUCTURES UNDER DYNAMIC LOADING

2013 ◽  
Author(s):  
Albert Darien Liu
Keyword(s):  
Dynamic Loading ◽  
Composite Structures ◽  
Mass Sensor ◽  
Sensor Location ◽  
Sensor Mass

Optimization of laminated composite structures under nonlinear dynamic loading using the equivalent static load method

2021 ◽  
Vol 35 (9) ◽  
pp. 4105-4113
Author(s):  
Yijae Choi ◽  
Jaemin Moon ◽  
Jinhwan Park ◽  
Seungmin Song ◽  
Mai Duc Dai ◽  
...  
Keyword(s):  
Dynamic Loading ◽  
Nonlinear Dynamic ◽  
Composite Structures ◽  
Static Load ◽  
Laminated Composite ◽  
Equivalent Static Load ◽  
Laminated Composite Structures

scholarly journals A review of composite structures subjected to dynamic loading

2007 ◽  
Vol 12 (4) ◽  
pp. 411-428 ◽  
Author(s):  
P R Hampson ◽  
M Moatamedi
Keyword(s):  
Dynamic Loading ◽  
Composite Structures

scholarly journals A Review on Exploring the Behavior of Multi-Layer Composite Structures Under Dynamic Loading

2016 ◽  
Author(s):  
Saima Ali ◽  
◽  
Xuemei Liu ◽  
Sabrina Fawzia ◽  
Jun Wu ◽  
...  
Keyword(s):  
Dynamic Loading ◽  
Composite Structures ◽  
Layer Composite

Sensor location analysis for nonlinear-acoustics-based damage detection in composite structures

2012 ◽  
Author(s):  
Andrzej Klepka ◽  
Wieslaw J. Staszewski ◽  
Francesco Aymerich ◽  
Tadeusz Uhl
Keyword(s):  
Damage Detection ◽  
Composite Structures ◽  
Nonlinear Acoustics ◽  
Location Analysis ◽  
Sensor Location

Impact source localization for composite structures under external dynamic loading condition

2014 ◽  
Vol 24 (4) ◽  
pp. 359-374 ◽  
Author(s):  
Byeong-Wook Jang ◽  
Yeon-Gwan Lee ◽  
Chun-Gon Kim ◽  
Chan-Yik Park
Keyword(s):  
Dynamic Loading ◽  
Source Localization ◽  
Composite Structures ◽  
Loading Condition ◽  
Dynamic Loading Condition

In Situ microscopy of the anodic etching of silicon

1995 ◽  
Vol 53 ◽  
pp. 232-233
Author(s):  
Frances M. Ross ◽  
Peter C. Searson
Keyword(s):  
Composite Structures ◽  
High Surface ◽  
High Surface Area ◽  
Chemical Properties ◽  
Selective Etching ◽  
Silicon On Insulator ◽  
Second Phase ◽  
Porous Layers ◽  
New Class ◽  
Porous Semiconductors

Porous semiconductors represent a relatively new class of materials formed by the selective etching of a single or polycrystalline substrate. Although porous silicon has received considerable attention due to its novel optical properties1, porous layers can be formed in other semiconductors such as GaAs and GaP. These materials are characterised by very high surface area and by electrical, optical and chemical properties that may differ considerably from bulk. The properties depend on the pore morphology, which can be controlled by adjusting the processing conditions and the dopant concentration. A number of novel structures can be fabricated using selective etching. For example, self-supporting membranes can be made by growing pores through a wafer, films with modulated pore structure can be fabricated by varying the applied potential during growth, composite structures can be prepared by depositing a second phase into the pores and silicon-on-insulator structures can be formed by oxidising a buried porous layer. In all these applications the ability to grow nanostructures controllably is critical.

Impact on Composite Structures

1998 ◽  
Author(s):  
Serge Abrate
Keyword(s):  
Composite Structures

MODES OF FAILURE OF MATERIALS UNDER THE DYNAMIC LOADING

1988 ◽  
Vol 49 (C3) ◽  
pp. C3-295-C3-299
Author(s):  
J. SUVOROVA
Keyword(s):  
Dynamic Loading ◽  
Modes Of Failure
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