Electrical Characteristics of Amorphous Semiconductor Thin Film of As-Te-Ge-Si System

IEEJ Transactions on Fundamentals and Materials ◽

10.1541/ieejfms1972.95.284 ◽

1975 ◽

Vol 95 (7) ◽

pp. 284-291

Author(s):

T. MIYAZONO ◽

T. SHIRAISHI ◽

T. KUROSU ◽

M. IIDA

Keyword(s):

Thin Film ◽

Amorphous Semiconductor ◽

Electrical Characteristics ◽

Semiconductor Thin Film

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Electrical characteristics of amorphous semiconductor thin film of As-Te-Ge-Si system

Electrical Engineering in Japan ◽

10.1002/eej.4390950403 ◽

1975 ◽

Vol 95 (4) ◽

pp. 14-19 ◽

Author(s):

T. Miyazono ◽

T. Shiraishi ◽

T. Kurosu ◽

M. Iida

Keyword(s):

Thin Film ◽

Amorphous Semiconductor ◽

Electrical Characteristics ◽

Semiconductor Thin Film

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Modeling of Spiking Analog Neural Circuits with Hebbian Learning, Using Amorphous Semiconductor Thin Film Transistors with Silicon Oxide Nitride Semiconductor Split Gates

Artificial Neural Networks and Machine Learning – ICANN 2012 - Lecture Notes in Computer Science ◽

10.1007/978-3-642-33269-2_12 ◽

2012 ◽

pp. 89-96

Author(s):

Richard Wood ◽

Ian Bruce ◽

Peter Mascher

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Silicon Oxide ◽

Neural Circuits ◽

Hebbian Learning ◽

Amorphous Semiconductor ◽

Nitride Semiconductor ◽

Semiconductor Thin Film

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Colour detection using amorphous semiconductor thin-film alloys

Sensors and Actuators A Physical ◽

10.1016/0924-4247(93)80192-j ◽

1993 ◽

Vol 36 (3) ◽

pp. 187-192 ◽

Author(s):

J. Wind ◽

G. Krötz ◽

R. Schmiedgen ◽

W. Legner ◽

V. Hechtenberg ◽

...

Keyword(s):

Thin Film ◽

Amorphous Semiconductor ◽

Semiconductor Thin Film

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Frequency dependence of negative-capacitance effects observed in amorphous semiconductor thin-film devices

Electronics Letters ◽

10.1049/el:19710484 ◽

1971 ◽

Vol 7 (24) ◽

pp. 706 ◽

Author(s):

J. Allison ◽

V.R. Dawe

Keyword(s):

Thin Film ◽

Frequency Dependence ◽

Amorphous Semiconductor ◽

Negative Capacitance ◽

Semiconductor Thin Film ◽

Capacitance Effects ◽

Thin Film Devices

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Electrical Characteristics of Low-Temperature Polycrystalline Silicon Complementary Metal–Oxide–Semiconductor Thin-Film Transistors with Six-Step Photomask Structure

Japanese Journal of Applied Physics ◽

10.1143/jjap.50.061401 ◽

2011 ◽

Vol 50 (6) ◽

pp. 061401

Author(s):

Sang-Jin Lee ◽

Jae-Hoon Park ◽

Kum-Mi Oh ◽

Seok-Woo Lee ◽

Kyung-Eon Lee ◽

...

Keyword(s):

Thin Film ◽

Low Temperature ◽

Metal Oxide ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Complementary Metal Oxide Semiconductor ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Electrical Characteristics ◽

Semiconductor Thin Film

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Statistical Origin of the Meyer-Neldel Rule in Amorphous Semiconductor Thin Film Transistors

Japanese Journal of Applied Physics ◽

10.1143/jjap.29.1639 ◽

1990 ◽

Vol 29 (Part 1, No. 9) ◽

pp. 1639-1648 ◽

Author(s):

Minoru Kikuchi

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Amorphous Semiconductor ◽

Semiconductor Thin Film

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Electrical Characteristics of Low-Temperature Polycrystalline Silicon Complementary Metal–Oxide–Semiconductor Thin-Film Transistors with Six-Step Photomask Structure

Japanese Journal of Applied Physics ◽

10.7567/jjap.50.061401 ◽

2011 ◽

Vol 50 (6R) ◽

pp. 061401 ◽

Author(s):

Sang-Jin Lee ◽

Jae-Hoon Park ◽

Kum-Mi Oh ◽

Seok-Woo Lee ◽

Kyung-Eon Lee ◽

...

Keyword(s):

Thin Film ◽

Low Temperature ◽

Metal Oxide ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Complementary Metal Oxide Semiconductor ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Electrical Characteristics ◽

Semiconductor Thin Film

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Helicity dependent temporal profile of the semiconductor thin film photoresponse

Applied Physics Letters ◽

10.1063/5.0051082 ◽

2021 ◽

Vol 118 (20) ◽

pp. 201105

Author(s):

Gennady M. Mikheev ◽

Arseniy E. Fateev ◽

Vladimir Ya. Kogai ◽

Tatyana N. Mogileva ◽

Viatcheslav V. Vanyukov ◽

...

Keyword(s):

Thin Film ◽

Temporal Profile ◽

Semiconductor Thin Film

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Analysis of Carrier Mobility in Amorphous Metal-Oxide Semiconductor Thin-Film Transistor using Hall Effect

IEEE Electron Device Letters ◽

10.1109/led.2020.2993268 ◽

2020 ◽

pp. 1-1

Author(s):

Kota Imanishi ◽

Tokiyoshi Matsuda ◽

Mutsumi Kimura

Keyword(s):

Thin Film ◽

Metal Oxide ◽

Hall Effect ◽

Carrier Mobility ◽

Thin Film Transistor ◽

Amorphous Metal ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Semiconductor Thin Film ◽

Amorphous Metal Oxide

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Organic Semiconductors: Solutal‐Marangoni‐Flow‐Mediated Growth of Patterned Highly Crystalline Organic Semiconductor Thin Film Via Gap‐Controlled Bar Coating (Adv. Funct. Mater. 28/2021)

Advanced Functional Materials ◽

10.1002/adfm.202170200 ◽

2021 ◽

Vol 31 (28) ◽

pp. 2170200

Author(s):

Seon Baek Lee ◽

Siyoung Lee ◽

Dae Gun Kim ◽

Seung Hyun Kim ◽

Boseok Kang ◽

...

Keyword(s):

Thin Film ◽

Organic Semiconductors ◽

Organic Semiconductor ◽

Marangoni Flow ◽

Semiconductor Thin Film ◽

Organic Semiconductor Thin Film

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