Enhancement of critical current density in YBa2Cu3Ox superconductor by mechanical deformation

1993 ◽  
Vol 8 (2) ◽  
pp. 249-254 ◽  
Author(s):  
V. Selvamanickam ◽  
M. Mironova ◽  
K. Salama

The critical current density of melt-textured YBa2Cu3Ox superconductor has been enhanced by mechanical deformation at a high temperature. Hot deformation at 45° to both the slip plane (001) and the slip directions [100]/[010] has resulted in a high density of dislocation loops and stacking faults. The deformed samples are found to exhibit a critical current density (Jc) at Hc-axis as high as that at Ha-b plane at 1.5 T and 77 K. A Jc of 35300 A/cm2 has been achieved at Hc (1.5 T and 77 K) which is twice as high as that observed in undeformed samples. The enhanced Jc in this magnetic field orientation is attributed to pinning by the defects created by mechanical deformation. This pinning mechanism is found to be effective over a wide angle between the magnetic field and the a-b plane and thus results in a marked reduction in the critical current anisotropy.

1992 ◽  
Vol 170 (2) ◽  
pp. 549-562 ◽  
Author(s):  
D. Glatzer ◽  
A. Forkl ◽  
H. Theuss ◽  
H. U. Habermeier ◽  
H. Kronmüller

1992 ◽  
Vol 46 (17) ◽  
pp. 10986-10996 ◽  
Author(s):  
L. M. Fisher ◽  
V. S. Gorbachev ◽  
N. V. Il’in ◽  
N. M. Makarov ◽  
I. F. Voloshin ◽  
...  

1994 ◽  
pp. 559-562
Author(s):  
Yuko Yokoyama ◽  
Tomoya Kubo ◽  
Yoshihiko Nakagawa ◽  
Masaithi Umeda ◽  
Yoshishige Suzuki ◽  
...  

1989 ◽  
Vol 169 ◽  
Author(s):  
L. W. Song ◽  
Y. H. Kao ◽  
Q. Y. Ying ◽  
J. P. Zheng ◽  
H. S. Kwok ◽  
...  

AbstractThe variations of critical current density Jc of narrow Y‐Ba‐Cu‐O films as a function of temperature and magnetic field are investigated. Films with thickness of 150‐200 nm and width of 20‐100 urn were prepared by laser ablation and laser etching. For t (=T/TC) < 0.75, the temperature dependence of Jc shows a (1‐1) linear behavior, in sharp contrast to that of a Josephson junction. Near Tc, Jc varies with (1‐ t)n where n=3/2 or 2 depending on the morphology of films. The magnetic field dependence of Jc above a characteristic field value Hc’ can be described by a model based on flux creep.


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