Local and Electronic Structure of Siloxene

1999 ◽  
Vol 14 (4) ◽  
pp. 1235-1237 ◽  
Author(s):  
Ernst Z. Kurmaev ◽  
Sergei N. Shamin ◽  
David L. Ederer ◽  
Ursula Dettlaff-Weglikowska ◽  
Jörg Weber

Silicon L2,3 x-ray emission spectra (XES) of siloxene powder samples prepared according to Wöohler and Kautsky (Wöhler and Kautsky siloxene) are presented. The results are compared with the Si L2,3 spectra of the reference compounds a-Si, c-Si, SiO2, and SiOx. A close similarity of the electronic structure of Wöhler siloxene to that of a-SiO0.43: H and of Kautsky siloxene to that of a-SiO0.87: H is found. We determine the number of oxygen atoms per Si atom at ~0.5 in Wöhler siloxene and ~0.8 in Kautsky siloxene. The relative concentrations are in good agreement with the results of infrared absorption measurements on the same samples.

2002 ◽  
Vol 09 (02) ◽  
pp. 1097-1102
Author(s):  
E. Z. KURMAEV ◽  
I. I. LYAKHOVSKAYA ◽  
J. KORTUS ◽  
M. DEMETER ◽  
M. NEUMANN ◽  
...  

Measurements of X-ray emission and absorption of the constituents of MgB 2 are presented. The results obtained are in good agreement with calculated X-ray spectra, with dipole matrix elements taken into account. The comparison of X-ray emission spectra of graphite, AlB 2, and MgB 2 in the binding energy scale supports the idea of charge transfer from σ to π bands, which creates holes at the top of the bonding σ bands and drives the high-Tc superconductivity in MgB 2.


1980 ◽  
Vol 21 (3) ◽  
pp. 286-290 ◽  
Author(s):  
N. I. Lazukova ◽  
V. A. Gubanov ◽  
M. P. Butsman ◽  
V. M. Cherkashenko ◽  
�. Z. Kurmaev ◽  
...  

1989 ◽  
Vol 40 (7) ◽  
pp. 4442-4452 ◽  
Author(s):  
Noriaki Hamada ◽  
Sandro Massidda ◽  
Arthur J. Freeman ◽  
Joseph Redinger

1996 ◽  
Vol 449 ◽  
Author(s):  
Kevin E. Smith ◽  
Sarnjeet S Dhesi ◽  
Laurent-C. Duda ◽  
Cristian B Stagarescu ◽  
J. H. Guo ◽  
...  

ABSTRACTThe electronic structure of thin film wurtzite GaN has been studied using a combination of angle resolved photoemission, soft x-ray absorption and soft x-ray emission spectroscopies. We have measured the bulk valence and conduction band partial density of states by recording Ga L- and N K- x-ray emission and absorption spectra. We compare the x-ray spectra to a recent ab initio calculation and find good overall agreement. The x-ray emission spectra reveal that the top of the valence band is dominated by N 2p states, while the x-ray absorption spectra show the bottom of the conduction band as a mixture of Ga 4s and N 2p states, again in good agreement with theory. However, due to strong dipole selection rules we can also identify weak hybridization between Ga 4s- and N 2p-states in the valence band. Furthermore, a component to the N K-emission appears at approximately 19.5 eV below the valence band maximum and can be identified as due to hybridization between N 2p and Ga 3d states. We report preliminary results of a study of the full dispersion of the bulk valence band states along high symmetry directions of the bulk Brillouin zone as measured using angle resolved photoemission. Finally, we tentatively identify a non-dispersive state at the top of the valence band in parts of the Brillouin zone as a surface state.


1979 ◽  
Vol 29 (3) ◽  
pp. 185-190 ◽  
Author(s):  
V.I. Anisimov ◽  
V.A. Gubanov ◽  
A.L. Ivanovskii ◽  
E.Z. Kurmaev ◽  
J. Weber ◽  
...  

JETP Letters ◽  
2013 ◽  
Vol 96 (11) ◽  
pp. 710-713 ◽  
Author(s):  
V. R. Galakhov ◽  
S. N. Shamin ◽  
E. M. Mironova ◽  
M. A. Uimin ◽  
A. Ye. Yermakov ◽  
...  

1980 ◽  
Vol 18 (2) ◽  
pp. 227-233 ◽  
Author(s):  
M. Rizhkov ◽  
V.A. Gubanov ◽  
M.P. Bytzman ◽  
A.L. Hagström ◽  
E.Z. Kurmaev

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