scholarly journals Assessing atomically thin delta-doping of silicon using mid-infrared ellipsometry

2020 ◽  
Vol 35 (16) ◽  
pp. 2098-2105 ◽  
Author(s):  
Aaron M. Katzenmeyer ◽  
Ting S. Luk ◽  
Ezra Bussmann ◽  
Steve Young ◽  
Evan M. Anderson ◽  
...  
Keyword(s):  
Mid Infrared ◽  
Infrared Ellipsometry ◽  
Delta Doping ◽  
Image Position

Abstract

scholarly journals Influence of delta-doping on the hole capture probability in Ge/Si quantum dot mid-infrared photodetectors

2014 ◽  
Vol 9 (1) ◽  
Author(s):  
Andrew Yakimov ◽  
Victor Kirienko ◽  
Vyacheslav Timofeev ◽  
Aleksei Bloshkin ◽  
Anatolii Dvurechenskii
Keyword(s):  
Quantum Dot ◽  
Capture Probability ◽  
Infrared Photodetectors ◽  
Mid Infrared ◽  
Hole Capture ◽  
Si Quantum Dot ◽  
Delta Doping

scholarly journals Highly strained Ge micro-blocks bonded on Si platform for mid-infrared photonic applications

2017 ◽  
Vol 7 (3) ◽  
pp. 691-694 ◽  
Author(s):  
A. Gassenq ◽  
K. Guilloy ◽  
N. Pauc ◽  
D. Rouchon ◽  
J. Widiez ◽  
...  
Keyword(s):  
Mid Infrared ◽  
Image Position ◽  
Highly Strained

Abstract

Mid-infrared ellipsometry, Raman and X-ray diffraction studies of Al Ga1−N/AlN/Si structures

2017 ◽  
Vol 421 ◽  
pp. 859-865 ◽  
Author(s):  
Chennan Wang ◽  
Ondřej Caha ◽  
Filip Münz ◽  
Petr Kostelník ◽  
Tomáš Novák ◽  
...  
Keyword(s):  
X Ray Diffraction ◽  
Mid Infrared ◽  
X Ray ◽  
Infrared Ellipsometry

scholarly journals Porosity and thickness characterization of porous Si and oxidized porous Si layers – An ultraviolet–visible–mid infrared ellipsometry study

2016 ◽  
Vol 227 ◽  
pp. 112-120 ◽  
Author(s):  
Balint Fodor ◽  
Emil Agocs ◽  
Benjamin Bardet ◽  
Thomas Defforge ◽  
Frederic Cayrel ◽  
...  
Keyword(s):  
Porous Si ◽  
Mid Infrared ◽  
Infrared Ellipsometry

Structure analysis of organic films by mid-infrared ellipsometry

2004 ◽  
Vol 455-456 ◽  
pp. 266-271 ◽  
Author(s):  
K. Hinrichs ◽  
A. Röseler ◽  
M. Gensch ◽  
E.H. Korte
Keyword(s):  
Structure Analysis ◽  
Organic Films ◽  
Mid Infrared ◽  
Infrared Ellipsometry

Influence of delta-doping on the performance of Ge/Si quantum-dot mid-infrared photodetectors

2012 ◽  
Vol 112 (3) ◽  
pp. 034511 ◽  
Author(s):  
A. I. Yakimov ◽  
V. A. Timofeev ◽  
A. A. Bloshkin ◽  
V. V. Kirienko ◽  
A. I. Nikiforov ◽  
...  
Keyword(s):  
Quantum Dot ◽  
Infrared Photodetectors ◽  
Mid Infrared ◽  
Si Quantum Dot ◽  
Delta Doping

Epitaxy growth and characterization of InAs p-i-n photodetector through ion exchange for mid-infrared detection on Si substrates

2018 ◽  
Vol 8 (03) ◽  
pp. 1085-1091 ◽  
Author(s):  
Wan Khai Loke ◽  
Kian Hua Tan ◽  
Satrio Wicaksono ◽  
Soon Fatt Yoon
Keyword(s):  
Ion Exchange ◽  
Infrared Detection ◽  
Mid Infrared ◽  
Si Substrates ◽  
Image Position

Abstract

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