Study of defects and structural transformations induced by ion irradiation of Y2O3 thin films deposited by Ion Beam Sputtering
Keyword(s):
Ion Beam
◽
AbstractY2O3 thin films deposited by Ion Beam Sputtering (IBS) deposition technique exhibit a particular disordered microstructure. In order to obtain a better knowledge on phase transition mechanisms occurring during irradiation, thin films with different microstructures have been implanted with xenon ions at different energies and different doses. This work established two types of transition (cubic-amorphous or cubic-monoclinic) depending mainly on the ion energy with a possibility to control the damaging kinetic via the pre-existing oxygen disorder.
Nitrogen‐ion irradiation during the deposition of C1−xNx thin films by ion beam sputtering technique
1996 ◽
Vol 14
(3)
◽
pp. 777-780
◽
Keyword(s):
Ion Beam
◽
1994 ◽
Vol 68-69
◽
pp. 279-284
◽