Real Time X-Ray Studies of Interface Kinetics in Epitaxial Strained Layers

1991 ◽  
Vol 230 ◽  
Author(s):  
Roy Clarke ◽  
Waldemar Dos Passos ◽  
Walter Lowe ◽  
Brian Rodricks ◽  
Cristine Brizard
Keyword(s):  
Lattice Strain ◽  
Layer Structure ◽  
Strain Relaxation ◽  
Ray Method ◽  
Strained Layers ◽  
Time Resolved ◽  
X Ray ◽  
Interface Kinetics ◽  
Kinetics Of ◽  
Radiation Measurements

AbstractA new time-resolved x-ray method of probing the kinetics of interfacial strains in semiconductor heterostructures is presented. High-resolution synchrotron radiation measurements of the strain relaxation during rapid thermal annealing (RTA) show that the lattice strain of an as-grown strained layer structure GaAs-Inx.Ga1−x-As-GaAs/GaAs is relieved cooperatively by a series of sluggish discontinuous transitions. We find that ion implantation enhances the annealing kinetics of InAlAs strained layers.

In situ Time-Resolved Small-Angle X-ray Scattering Reveals the Formation Kinetics of Polyelectrolyte Complex Micelles

2019 ◽  
Author(s):  
Hao Wu ◽  
Jeffrey Ting ◽  
Siqi Meng ◽  
Matthew Tirrell
Keyword(s):  
Small Angle ◽  
Self Assembly ◽  
Electrostatic Interactions ◽  
Polyelectrolyte Complex ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Kinetics Of ◽  
Ray Scattering

We have directly observed the <i>in situ</i> self-assembly kinetics of polyelectrolyte complex (PEC) micelles by synchrotron time-resolved small-angle X-ray scattering, equipped with a stopped-flow device that provides millisecond temporal resolution. This work has elucidated one general kinetic pathway for the process of PEC micelle formation, which provides useful physical insights for increasing our fundamental understanding of complexation and self-assembly dynamics driven by electrostatic interactions that occur on ultrafast timescales.

The kinetics of conformational changes of α2 -macroglobulin determined by time resolved X-ray solution scattering

FEBS Letters ◽  
1994 ◽  
Vol 337 (2) ◽  
pp. 171-174 ◽  
Author(s):  
Hideo Arakawa ◽  
Takuji Urisaka ◽  
Hirotsugu Tsuruta ◽  
Yoshiyuki Amemiya ◽  
Hiroshi Kihara ◽  
...  
Keyword(s):  
Conformational Changes ◽  
Time Resolved ◽  
X Ray ◽  
Α2 Macroglobulin ◽  
Kinetics Of

Time-Resolved Reflectivity Study of Solid-Phase Epitaxial Regrowth in Relaxed and Strained Si1−xGex Epilayers

1992 ◽  
Vol 281 ◽  
Author(s):  
T. E. Haynes ◽  
C. Lee ◽  
K. S. Jones
Keyword(s):  
Composition Dependence ◽  
Solid Phase ◽  
Strain Relaxation ◽  
Alloy Layer ◽  
Atomic Fraction ◽  
Bulk Alloy ◽  
Strained Layers ◽  
Time Resolved ◽  
Epitaxial Regrowth ◽  
Different Types

ABSTRACTThe rate of solid-phase epitaxial regrowth has been studied using time-resolved reflectivity in three different types of SiGe/Si epilayers amorphized by ion implantation. In two of these cases, the alloy epilayer contained either 12% or 20% Ge, and the amorphization depth was greater than the thickness (2000 Å) of the SiGe alloy layer. Time-resolved reflectivity measurements showed that the rate of regrowth was not constant in these two cases, but first decreased after passing the SiGe/Si interface, and then increased. The minimum regrowth rate occurred closer to the SiGe/Si interface in the epilayers with the larger Ge atomic fraction. In the third type of sample, the alloy epilayer thickness was ∼7μm, so that the initial epilayer (15% Ge) had the lattice constant of the bulk alloy. Furthermore, amorphization and regrowth occurred entirely within the relaxed alloy layer. In this case, the regrowth rate was constant. The composition dependence of the regrowth-rate transient in the strained layers is discussed in the context of a ‘critical-thickness’ model of strain relaxation.

scholarly journals In situ structural kinetics of picosecond laser-induced heating and fragmentation of colloidal gold spheres

2020 ◽  
Vol 22 (9) ◽  
pp. 4993-5001 ◽  
Author(s):  
Anna Rosa Ziefuss ◽  
Stefan Reich ◽  
Sven Reichenberger ◽  
Matteo Levantino ◽  
Anton Plech
Keyword(s):  
Colloidal Gold ◽  
Picosecond Laser ◽  
Time Resolved ◽  
Gold Colloids ◽  
X Ray ◽  
X Ray Scattering ◽  
Kinetics Of ◽  
Ray Scattering

The structural and energetic pathway of picosecond laser fragmentation of gold colloids has been clarified by time-resolved X-ray scattering.

Kinetics of Multi-Step Redox Processes by Time-Resolved In Situ X-ray Diffraction

2016 ◽  
Vol 88 (11) ◽  
pp. 1684-1692 ◽  
Author(s):  
Lukas C. Buelens ◽  
Vladimir V. Galvita ◽  
Hilde Poelman ◽  
Christophe Detavernier ◽  
Guy B. Marin
Keyword(s):  
Redox Processes ◽  
X Ray Diffraction ◽  
Time Resolved ◽  
X Ray ◽  
Kinetics Of

Kinetics of the lamellar-inverse hexagonal phase transition determined by time-resolved x-ray diffraction

Biochemistry ◽  
1992 ◽  
Vol 31 (4) ◽  
pp. 1081-1092 ◽  
Author(s):  
Mark W. Tate ◽  
Erramilli Shyamsunder ◽  
Sol M. Gruner ◽  
Kevin L. D'Amico
Keyword(s):  
Phase Transition ◽  
Hexagonal Phase ◽  
X Ray Diffraction ◽  
Time Resolved ◽  
X Ray ◽  
Kinetics Of

Dynamical Response of the Electric Double Layer Structure of the DEME-TFSI Ionic Liquid to Potential Changes Observed by Time-Resolved X-ray Reflectivity

2016 ◽  
Vol 230 (4) ◽  
Author(s):  
Wolfgang Voegeli ◽  
Etsuo Arakawa ◽  
Tadashi Matsushita ◽  
Osami Sakata ◽  
Yusuke Wakabayashi
Keyword(s):  
Ionic Liquid ◽  
Double Layer ◽  
Time Scale ◽  
Electric Double Layer ◽  
Structural Changes ◽  
Layer Structure ◽  
Dynamical Response ◽  
Relaxation Processes ◽  
Time Resolved ◽  
X Ray

AbstractThe interface between the N,N-diethyl-N-methyl-N-(2-methoxyethyl)ammonium bis(trifluoromethanesulfonyl)imide (DEME-TFSI) ionic liquid and a gold (111) surface was investigated with time-resolved X-ray reflectivity in order to clarify the dynamics of structural changes of the electric double layer after changing the electrode potential. In the experiment, the potential was switched repeatedly between +1.5 V and −1.5 V every 2 s or every 0.3 s, while measuring the specular X-ray reflectivity. When the potential was switched every 2 s, the time dependence of the reflectivity was different from that of the accumulated charge. This indicates structural relaxation processes that occur on a slower time scale than the acummulation of the charge at the electric double layer.When the potential was switched every 0.3 s, on the other hand, the reflectivity changes followed the evolution of the charge of the electric double layer within the experimental precision, indicating that slow relaxation processes without charge transfer do not contribute significantly to structural changes at this time scale.

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