In-Situ Electron Microscopy Studies of The Behavior of Metal Particles on Ceramic Substrates

1994 ◽  
Vol 357 ◽  
Author(s):  
R. Terry ◽  
K. Baker ◽  
Nelly M. Rodriguez
Keyword(s):  
Electron Microscopy ◽  
Morphological Characteristics ◽  
Metal Particles ◽  
Ceramic Substrates ◽  
Transmission Electron ◽  
In Situ Electron Microscopy ◽  
Metal Support Interaction ◽  
Metal Support ◽  
Insight Into

AbstractThis paper is devoted to a discussion of how the information derived from the application of in-situ transmission electron microscopy can be used to gain a unique insight into the manner by which various factors dictate the morphological characteristics of metal particles on a variety of ceramic substrates. In this context, we have used the technique to examine the influence of the strength of the metal-support interaction on the mode of sintering of small particles, and how the chemical nature of the gas environment can induce significant changes in the shapes of the metal particles in a given system. Attention is also focussed on the wetting behavior of metal particles dispersed on graphite when reacted in oxygen and how this aspect impacts on their subsequent mode of catalytic attack.

scholarly journals Fabrication of a liquid cell for in situ transmission electron microscopy

Microscopy ◽  
2020 ◽  
Author(s):  
Xiaoguang Li ◽  
Kazutaka Mitsuishi ◽  
Masaki Takeguchi
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Cost Effective ◽  
Production Method ◽  
Microscopy Imaging ◽  
Transmission Electron ◽  
In Situ Electron Microscopy ◽  
Liquid Cell ◽  
Si Wafer

Abstract Liquid cell transmission electron microscopy (LCTEM) enables imaging of dynamic processes in liquid with high spatial and temporal resolution. The widely used liquid cell (LC) consists of two stacking microchips with a thin wet sample sandwiched between them. The vertically overlapped electron-transparent membrane windows on the microchips provide passage for the electron beam. However, microchips with imprecise dimensions usually cause poor alignment of the windows and difficulty in acquiring high-quality images. In this study, we developed a new and efficient microchip fabrication process for LCTEM with a large viewing area (180 µm × 40 µm) and evaluated the resultant LC. The new positioning reference marks on the surface of the Si wafer dramatically improve the precision of dicing the wafer, making it possible to accurately align the windows on two stacking microchips. The precise alignment led to a liquid thickness of 125.6 nm close to the edge of the viewing area. The performance of our LC was demonstrated by in situ transmission electron microscopy imaging of the dynamic motions of 2-nm Pt particles. This versatile and cost-effective microchip production method can be used to fabricate other types of microchips for in situ electron microscopy.

In Situ Electron Microscopy Studies of Surface Dynamical Processes

1998 ◽  
Vol 4 (S2) ◽  
pp. 608-609
Author(s):  
Ruud M. Tromp
Keyword(s):  
Electron Microscopy ◽  
Strain Relaxation ◽  
High Vacuum ◽  
Ultra High Vacuum ◽  
Relaxation Phase ◽  
Transmission Electron ◽  
In Situ Electron Microscopy ◽  
Low Energy Electron ◽  
New Machine

To obtain a full and detailed understanding of the spatiotemporal dynamics of surface processes such as epitaxial growth, strain relaxation, phase transformations and phase transitions, chemisorption and etching, in situ real-time observations have proven to be invaluable. The development of two experimental techniques, i.e. Low Energy Electron Microscopy (LEEM) typically operating at electron energies below 10 eV, and Ultra-High-Vacuum Transmission Electron Microscopy (UHV-TEM) at several 100 keV, has made such in situ studies routinely possible. In many cases, the videodata obtained from such experiments are amenable to detailed, quantitative analysis, yielding statistical, kinetic and thermodynamic information that cannot be obtained in any other way.I will discuss recent experimental developments, including the design and construction of a new and improved LEEM instrument. Figure 1 shows a schematic diagram of this new machine. There are several features that distinguishes this design from most other LEEMs. One is the use of a 90 degree deflection magnetic prism array,

scholarly journals Applications of in situ electron microscopy in oxygen electrocatalysis

2022 ◽  
Author(s):  
Zhi-Peng Wu ◽  
Hui Zhang ◽  
Cailing Chen ◽  
Guanxing Li ◽  
Yu Han
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Degradation Mechanism ◽  
Structural Evolution ◽  
Reduction Reaction ◽  
Future Research ◽  
Electron Microscopic ◽  
Transmission Electron ◽  
In Situ Electron Microscopy

Oxygen electrocatalysis involving the oxygen reduction reaction (ORR) and oxygen evolution reaction (OER) plays a vital role in cutting-edge energy conversion and storage technologies. In situ studies of the evolution of catalysts during oxygen electrocatalysis can provide important insights into their structure - activity relationships and stabilities under working conditions. Among the various in situ characterization tools available, in situ electron microscopy has the unique ability to perform structural and compositional analyzes with high spatial resolution. In this review, we present the latest developments in in situ and quasi-in situ electron microscopic techniques, including identical location electron microscopy, in situ liquid cell (scanning) transmission electron microscopy and in situ environmental transmission electron microscopy, and elaborate their applications in the ORR and OER. Our discussion centers on the degradation mechanism, structural evolution and structure - performance correlations of electrocatalysts. Finally, we summarize the earlier discussions and share our perspectives on the current challenges and future research directions of using in situ electron microscopy to explore oxygen electrocatalysis and related processes.

scholarly journals Dynamic Investigation of Metal-support Interactions in Heterodimer Nanoparticles by in situ Transmission Electron Microscopy

2017 ◽  
Vol 23 (S1) ◽  
pp. 1858-1859
Author(s):  
Volkan Ortalan ◽  
Chang Wan Han ◽  
Jefferey Greeley ◽  
Chao Wang ◽  
Fabio H Ribeiro ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Transmission Electron ◽  
Metal Support ◽  
Metal Support Interactions ◽  
Dynamic Investigation

scholarly journals In situ electron microscopy observation of the redox process in plasmonic heterogeneous-photo-sensitive nanoparticles

2019 ◽  
Vol 1 (10) ◽  
pp. 3909-3917
Author(s):  
Diego Muraca ◽  
Lucia B. Scaffardi ◽  
Jesica M. J. Santillán ◽  
David Muñetón Arboleda ◽  
Daniel C. Schinca ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Ag Nanoparticles ◽  
Redox Process ◽  
Microscopy Observation ◽  
Electron Microscopy Observation ◽  
Transmission Electron ◽  
In Situ Electron Microscopy

Observation of relevant phenomena related with dynamical redox process in a plasmonic heterogeneous-photocatalyst system composed by Ag nanoparticles (NPs) in contact with amorphous AgCl NPs are reported by in situ transmission electron microscopy.

In situ liquid-cell transmission electron microscopy for direct observation of concentration-dependent growth and dissolution of silver nanoparticles

RSC Advances ◽  
2015 ◽  
Vol 5 (100) ◽  
pp. 82342-82345 ◽  
Author(s):  
Tae-Young Ahn ◽  
Seung-Pyo Hong ◽  
Seong-Il Kim ◽  
Young-Woon Kim
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Silver Nanoparticles ◽  
Real Time ◽  
Transmission Electron ◽  
Cell Transmission ◽  
Liquid Cell ◽  
Dependent Growth ◽  
Insight Into

Real-time liquid-cell transmission electron microscopy was utilized to gain insight into the growth and dissolution of silver nanoparticles.

In-Situ Electron Microscopy of Heterogeneous Catalysts

1982 ◽  
Vol 40 ◽  
pp. 640-643
Author(s):  
P. L. Gai
Keyword(s):  
Electron Microscopy ◽  
Heterogeneous Catalysis ◽  
Metal Particle ◽  
Heterogeneous Catalysts ◽  
Substantial Portion ◽  
Industrial Chemicals ◽  
New Information ◽  
In Situ Electron Microscopy ◽  
Insight Into

Selective oxidation and ammoxidation of hydrocarbons using metal oxide and supported metal particle catalysts account for a substantial portion of key industrial chemicals and are therefore, important. The selectivity and activity are critically dependent upon the changes in the microstructure of the catalysts. Origin of such changes pose important problems in heterogeneous catalysis and understanding them may provide a better insight into the catalyst performance. Applications of electron microscopy (EM) techniques are particularly useful providing additional and new information about such changes.

Applications of Ion Microscopy and In Situ Electron Microscopy to the Study of Electronic Materials and Devices

1998 ◽  
Vol 4 (3) ◽  
pp. 308-316 ◽  
Author(s):  
R. Hull ◽  
J. Demarest ◽  
D. Dunn ◽  
E.A. Stach ◽  
Q. Yuan
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Focused Ion Beam ◽  
Electronic Materials ◽  
Ion Beam ◽  
Microscopy Imaging ◽  
Transmission Electron ◽  
In Situ Electron Microscopy ◽  
Ion Microscopy

We discuss the application of ion microscopy and in situ electron microscopy to the study of electronic and optical materials and devices. We demonstrate how the combination of in situ transmission electron microscopy and focused ion beam microscopy provides new avenues for the study for such structures, enabling extension of these techniques to the study of dopant distributions, nanoscale stresses, three-dimensional structural and chemical reconstruction, and real-time evolution of defect microstructure. We also discuss in situ applications of thermal, mechanical, electrical, and optical stresses during transmission electron microscopy imaging.

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