Growth and Magnetic Properties of La0.65Pb0.35MnO3 Films

AbstractWe have successfully grown La0.65PbO.35MnO3 thin films by a RF magnetron sputtering method onto (100) LaAlO3 single crystal substrates. X-ray diffraction measurements are consistent with a (100) cubic orientation of the films. The fourfold symmetry showed by LEED(Low Energy Electron Diffraction) patterns indicate that the films have surface order. STM(Scanning Tunneling Microscopy) measurements indicate that the surface of the films were smooth, with approximate 5 nm roughness. XPS (X-ray Photoemission Spectroscopy) shows that the surface defect density in the films is comparatively low. The bulk magnetization of the films at 6K in 1 T magnetic field reached 77 emu/g and a Curie temperature near 354 K, close to maximum resistivity. A negative magnetoresistance of 47% was observed at 320K in 5.5 T magnetic field.

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Growth of highly oriented La0.84Sr0.16MnO3 perovskite films

Journal of Materials Research ◽

10.1557/jmr.1995.2518 ◽

1995 ◽

Vol 10 (10) ◽

pp. 2518-2522 ◽

Cited By ~ 18

Author(s):

Brandon W. Chung ◽

Eric L. Brosha ◽

Fernando H. Garzon ◽

Ian D. Raistrick ◽

Robert J. Houlton ◽

...

Keyword(s):

Thin Films ◽

Ion Beam ◽

Rf Magnetron Sputtering ◽

Scanning Tunneling ◽

X Ray Diffraction ◽

Stabilized Zirconia ◽

Tunneling Microscopy ◽

Sputtering Deposition ◽

X Ray ◽

Deposited Films

We have grown thin films of La0.84Sr0.16MnO3 on SrTiO3 (100), MgO (100), CeO2 (100)/Al2O3, and (100) oriented yttria-stabilized zirconia (YSZ) substrates by using a 90°off-axis RF magnetron sputtering deposition. X-ray diffraction analysis and ion beam channeling experiments reveal that the deposited films grow epitaxially on SrTiO3, biaxially textured on MgO, and highly textured on YSZ. Scanning tunneling microscopy reveals that the thin films possess extremely smooth surfaces.

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Van Der Waals Epitaxy of GaSe on WSe2

MRS Proceedings ◽

10.1557/proc-263-291 ◽

1992 ◽

Vol 263 ◽

Cited By ~ 4

Author(s):

O. Lang ◽

R. Schlaf ◽

Y. Tomm ◽

C. Pettenkofer ◽

W. Jaegermann

Keyword(s):

Electron Diffraction ◽

Photoelectron Spectroscopy ◽

Van Der Waals ◽

Low Energy ◽

Scanning Tunneling ◽

X Ray Diffraction ◽

Tunneling Microscopy ◽

X Ray ◽

Low Energy Electron Diffraction ◽

Low Energy Electron

ABSTRACTGaSe layers were grown on the van der Waals (0001) planes of WSe2 (van der Waals epitaxy). The substrate (0001) plane was cleaned in UHV by heating to 400°C. GaSe was deposited from resistively heated Knudsen cells at T=300° C. After annealing at 450°C an epitaxial GaSe overlayer is formed as evidenced by X-ray diffraction, scanning tunneling microscopy, low energy electron diffraction and photoelectron spectroscopy.

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Si Nanoribbons on Ag(110) Studied by Grazing-Incidence X-Ray Diffraction, Scanning Tunneling Microscopy, and Density-Functional Theory: Evidence of a Pentamer Chain Structure

Physical Review Letters ◽

10.1103/physrevlett.117.276102 ◽

2016 ◽

Vol 117 (27) ◽

Cited By ~ 17

Author(s):

Geoffroy Prévot ◽

Conor Hogan ◽

Thomas Leoni ◽

Romain Bernard ◽

Eric Moyen ◽

...

Keyword(s):

Density Functional Theory ◽

Scanning Tunneling Microscopy ◽

Density Functional ◽

Grazing Incidence ◽

Chain Structure ◽

Scanning Tunneling ◽

X Ray Diffraction ◽

Tunneling Microscopy ◽

Functional Theory ◽

X Ray

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Interface morphology of a Cr(001)/Fe(001) superlattice determined by scanning tunneling microscopy and x-ray diffraction: A comparison

Journal of Applied Physics ◽

10.1063/1.1330770 ◽

2001 ◽

Vol 89 (1) ◽

pp. 181-187 ◽

Cited By ~ 8

Author(s):

C. M. Schmidt ◽

D. E. Bürgler ◽

D. M. Schaller ◽

F. Meisinger ◽

H.-J. Güntherodt ◽

...

Keyword(s):

Scanning Tunneling Microscopy ◽

Scanning Tunneling ◽

Interface Morphology ◽

X Ray Diffraction ◽

Tunneling Microscopy ◽

X Ray

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Structures of sulfur on TiO2() determined by scanning tunneling microscopy, X-ray photoelectron spectroscopy and low-energy electron diffraction

Surface Science ◽

10.1016/s0039-6028(00)00849-9 ◽

2001 ◽

Vol 470 (3) ◽

pp. 347-360 ◽

Cited By ~ 56

Author(s):

E.L.D. Hebenstreit ◽

W. Hebenstreit ◽

U. Diebold

Keyword(s):

Electron Diffraction ◽

Scanning Tunneling Microscopy ◽

Photoelectron Spectroscopy ◽

Low Energy ◽

Energy Electron ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

X Ray ◽

Low Energy Electron Diffraction ◽

Low Energy Electron

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Scanning Tunneling Microscopy Imaging of Defects in Layered Compounds

MRS Proceedings ◽

10.1557/proc-209-605 ◽

1990 ◽

Vol 209 ◽

Author(s):

G. P. E. M. Van Bakell ◽

J. Th. M. De Hosson ◽

T. Hibma

Keyword(s):

Scanning Tunneling Microscopy ◽

Structural Features ◽

Layered Compounds ◽

Scanning Tunneling ◽

X Ray Diffraction ◽

Tunneling Microscopy ◽

Microscopy Imaging ◽

X Ray ◽

Sample Orientation ◽

Stm Images

ABSTRACTStructural features of TiS2 were studied by scanning tunneling microscopy (STM) and single-crystal X-ray diffraction was applied as a complementary technique. STM images in air and at room temperature revealed, beside the trigonal symmetry of the lattice, several new features having this symmetry as well. We conclude that these features not only are to be described by structural defect phenomena which affect octahedral sites in the 1T-CdI2 structure but tetrahedral sites as well. Sample orientation determination by X-ray diffraction provides a unique relation between feature types and sites. A model is proposed in which displaced Ti atoms account for the observed features.

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