Optical Characterization of Bulk GaN Grown from a Na/Ga Flux
Keyword(s):
Bulk Gan
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ABSTRACTBulk GaN crystals up to several mm in size, grown by a Na/Ga flux method, have been characterized using room and low temperature photoluminescence (PL) and panchromatic cathodoluminescence (CL) imaging. Highly resolved excitonic PL spectra are obtained for material grown in a new, large-scale reactor. The crystal polarity affects the incorporation of residual Zn and Mg or Si acceptors and the deep level luminescence bands in c-oriented platelets. A Zn (A°,X) triplet structure with unusual thermalization properties and a highly resolved structural defect related PL peak are observed. Striations are found in some of the smaller platelets by CL imaging, but are absent in the prismatic crystals.
2002 ◽
Vol 246
(3-4)
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pp. 299-306
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2003 ◽
Vol 252
(1-3)
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pp. 1-3
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2009 ◽
Vol 6
(S2)
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pp. S763-S766
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2004 ◽
Vol 27
(1-3)
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pp. 267-270
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2013 ◽
Vol 787
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pp. 281-285
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