scholarly journals Teacher Implementation of Structured Engineering Notebooks in Engineering Design-based STEM Integration Units (Fundamental)

2020 ◽  
Author(s):  
Hillary Merzdorf ◽  
Amanda Johnston ◽  
Kerrie Douglas ◽  
Tamara Moore
Author(s):  
Tamara J. Moore ◽  
Corey A. Mathis ◽  
S. Selcen Guzey ◽  
Aran W. Glancy ◽  
Emilie A. Siverling

2018 ◽  
Vol 4 (2) ◽  
pp. 213-234
Author(s):  
Mehmet Aydeniz ◽  
Kader Bilican

The purpose of current study was to explore the weaknesses and strengths in pre-service primary teachers’ (PST) conceptualization of STEM and their knowledge of STEM pedagogy after engaging in integrated STEM (science, technology, mathematics and engineering) activities for one semester. The course activities emphasized concepts related to engineering design process, the interrelatedness of STEM subjects, inquiry and problem solving. The integrated STEM activities were implemented for six weeks. Data were collected through a questionnaire, reflection papers, semi-structured interviews with a sub set of participants (n=8/20). Results show that engaging students in immersive STEM activities helped PSTs develop foundational knowledge regarding STEM, engineering design and STEM pedagogy, which they could built on later to more effectively teach through STEM integration. Discussion focuses on how PSTs and practicing teachers can be supported through sustained professional development for STEM integration pedagogy.


2019 ◽  
Vol 119 (8) ◽  
pp. 457-474 ◽  
Author(s):  
Emilie A. Siverling ◽  
Elizabeth Suazo‐Flores ◽  
Corey A. Mathis ◽  
Tamara J. Moore

Author(s):  
Michael T. Postek

The term ultimate resolution or resolving power is the very best performance that can be obtained from a scanning electron microscope (SEM) given the optimum instrumental conditions and sample. However, as it relates to SEM users, the conventional definitions of this figure are ambiguous. The numbers quoted for the resolution of an instrument are not only theoretically derived, but are also verified through the direct measurement of images on micrographs. However, the samples commonly used for this purpose are specifically optimized for the measurement of instrument resolution and are most often not typical of the sample used in practical applications.SEM RESOLUTION. Some instruments resolve better than others either due to engineering design or other reasons. There is no definitively accurate definition of how to quantify instrument resolution and its measurement in the SEM.


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