scholarly journals Evaluation of Yield Loss Assessment Caused due to Curvularia Leaf Spot (Curvularia lunata) in Maize

2021 ◽  
Vol 10 (9) ◽  
pp. 538-544
Author(s):  
Tarun Kumar Jatwa S. S. Sharma ◽  
Neeraj K. Meena Irfan Khan ◽  
Roop Singh Indu
Keyword(s):  
Plant Pathology ◽  
Leaf Spot ◽  
Yield Loss ◽  
Curvularia Lunata ◽  
Average Yield ◽  
Loss Assessment ◽  
Yield Loss Assessment ◽  
Plot Yield

An experiment was conducted during Kahrif 2017 and Kharif 2018 at department of plant pathology, Rajasthan collage of Agriculture, Udaipur, Raj. to find out the average yield loss assessment caused due to Curvularia leaf spot of maize. During Kharif 2017 estimated average yield loss was 21.69% with 18.56 % PDI and 1032.33 kg/plot yield in protected plot similarly in Kharif 2018 yield loss was 22.49% and 992.73 kg /plot yield with 18.07% PDI. On average yield loss caused due to CLS in maize in both years was estimated 22.06%.

scholarly journals Yield Loss Assessment and Determination of Control Thresholds for Anthracnose on Red Pepper

2015 ◽  
Vol 21 (1) ◽  
pp. 6-11 ◽  
Author(s):  
Ju-Hee Kim ◽  
Seong-Soo Cheong ◽  
Ki-Kwon Lee ◽  
Ju-Rak Yim ◽  
Sun-Woo Choi ◽  
...  
Keyword(s):  
Yield Loss ◽  
Red Pepper ◽  
Loss Assessment ◽  
Yield Loss Assessment

Identification of Sources of Resistance and Yield Loss Assessment for Aerial Blight and Anthracnose/Pod Blight Diseases in Soybean

2021 ◽  
Author(s):  
Pawan K. Amrate ◽  
M.K. Shrivastava ◽  
Gyanendra Singh
Keyword(s):  
Yield Loss ◽  
Pressure Field ◽  
Yield Losses ◽  
Loss Assessment ◽  
Sources Of Resistance ◽  
Yield Loss Assessment ◽  
Soybean Genotypes ◽  
Cent Disease ◽  
Disease Pressure ◽  
Soybean Diseases

Background: Aerial blight (Rhizoctonia solani Kuhn) and Anthracnose/pod blight (Colletotrichum truncatum) are important soybean diseases, affect most of the present varieties with varying intensity, in India. There are also few reports of resistance against both the diseases. Methods: To identify resistance, a set of 121 diverse soybean genotypes including six susceptible checks i.e. JS 93-05, JS 335, JS 72-280, Punjab 1, RKS 18 and VLS 58 were evaluated under high disease pressure field conditions during 2017, 2018 and 2019. Moreover, assessment of yield losses due to these diseases were also worked out in highly infected plants of susceptible checks.Result: It was observed that aerial blight (0.0-46.8 per cent) and anthracnose/pod blight (0.0-56.2 per cent) were affected soybean genotypes from R1 to R7 and V3 to R7 stages, respectively. The genotypes responded differently and showed absolute resistance to susceptible reaction. Out of 121 genotypes, only five genotypes i.e. JS 20-57, JSM 222, MACS 1407, PS 1611 and Cat 2126 B were found to be highly resistant against both the diseases. Per cent pod and yield losses were significantly correlated with varying severity of aerial blight (0.966** and 0.995**) and anthracnose/pod blight (0.957** and 0.995**), respectively. However, the highest yield loss of 41.0 and 64.8 per cent were recorded on 55.6 and 75.2 per cent disease index (at 90 days) of aerial blight and anthracnose/pod blight, respectively.

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