DETERMINATION OF TRACE IMPURITIES IN TANTALUM OXIDE FILMS BY INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY COMBINED WITH ION EXCHANGE
1992 ◽
Vol 7
(8)
◽
pp. 1195-1199
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2007 ◽
Vol 598
(2)
◽
pp. 214-218
◽
2016 ◽
Vol 31
(7)
◽
pp. 1480-1489
◽
1995 ◽
Vol 315
(3)
◽
pp. 331-338
◽
1998 ◽
Vol 369
(1-2)
◽
pp. 79-85
◽
2001 ◽
Vol 16
(6)
◽
pp. 598-602
◽
1992 ◽
Vol 7
(4)
◽
pp. 605
◽
1997 ◽
Vol 12
(4)
◽
pp. 421-428
◽
2004 ◽
Vol 19
(3)
◽
pp. 407
◽