Study of standard sample preparation for total reflection X-ray fluorescence spectrometry and of its application to high-accuracy analysis
2000 ◽
Vol 49
(2)
◽
pp. 131-132
1995 ◽
Vol 11
(3)
◽
pp. 499-504
◽
Yoshihiro MORI
◽
Kengo SHIMANOE
◽
Tadashi SAKON
1998 ◽
Vol 53
(1)
◽
pp. 101-115
◽
2004 ◽
Vol 53
(2)
◽
pp. 61-69
◽
Yoshihiro MORI
◽
Kenichi UEMURA
Hibiki Komatsu
◽
Hikari Takahara
◽
Wataru Matsuda
◽
Yoshinori Nishiwaki
2015 ◽
Vol 44
(6)
◽
pp. 451-457
◽
Eric DaSilva
◽
Alison Matthews David
◽
Ana Pejović-Milić
1999 ◽
Vol 365
(1-3)
◽
pp. 19-27
◽
H. Schwenke
◽
P. A. Beaven
◽
J. Knoth
2006 ◽
Vol 154
(3-4)
◽
pp. 261-268
◽
Stefan Woelfl
◽
Margarete Mages
◽
Francisco Encina
◽
Francisco Bravo
2007 ◽
Vol 62
(1)
◽
pp. 82-85
◽
Sangita Dhara
◽
Nand Lal Misra
◽
Khush Dev Singh Mudher
◽
Suresh Kumar Aggarwal
1998 ◽
Vol 13
(7)
◽
pp. 609-613
◽
R. Patrik Pettersson
◽
Marie Olsson
2017 ◽
Vol 89
(19)
◽
pp. 10422-10430
◽
Abhijit Saha
◽
Kaushik Sanyal
◽
Neetika Rawat
◽
Sadhan Bijoy Deb
◽
Manoj Kumar Saxena
◽
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