scholarly journals Full-range birefringence control with piezoelectric MEMS-based metasurfaces

Author(s):  
Chao Meng ◽  
Paul Thrane ◽  
Fei Ding ◽  
Sergey Bozhevolnyi

Abstract Dynamic polarization control is crucial for emerging highly integrated photonic systems with diverse metasurfaces being explored for its realization1–6, but efficient, fast, and broadband operation remains a cumbersome challenge. While efficient optical metasurfaces (OMSs) involving liquid crystals suffer from inherently slow responses1, other OMS realizations are limited either in the operating wavelength range (due to resonances involved)2,3 or in the range of birefringence tuning4–6. Capitalizing on our development of piezoelectric micro-electro-mechanical system (MEMS) based dynamic OMSs7, we demonstrate reflective MEMS-OMS dynamic wave plates (DWPs) with high polarization conversion efficiencies (~ 75%), broadband operation (~ 100 nm near the operating wavelength of 800 nm), fast responses (< 0.4 milliseconds) and full-range birefringence control that enables completely encircling the Poincaré sphere along trajectories determined by the incident light polarization and DWP orientation. Demonstrated complete electrical control over light polarization opens new avenues in further integration and miniaturization of optical networks and systems8,9.

1992 ◽  
Vol 112 (10) ◽  
pp. 597-605
Author(s):  
Yasuaki Kidoh ◽  
Hiroyoshi Onnagawa ◽  
Hiroyuki Okada ◽  
Kazuo Miyashita

2014 ◽  
Vol 1666 ◽  
Author(s):  
Juan A. Badán ◽  
Ricardo E. Marotti ◽  
Enrique A. Dalchiele ◽  
Daniel Ariosa ◽  
Francisco Martín ◽  
...  

ABSTRACTOptical properties of Si nanowire arrays (SiNWs) prepared on p-doped Si(111) and Si(100) substrates are studied. The SiNWs were synthesized by self-assembly electroless metal deposition nanoelectrochemistry in an ionic silver HF solution through selective etching. Total reflectance (Rt) and total diffuse reflectance (Rdt) of SiNWs change drastically in comparison to polished Si. To understand these changes diffuse reflectance (Rd) with polarized incident light was studied. For samples prepared on Si(111), the wavelength integrated Rd (wIRd) shows maxima at certain angle of incidence θ and it does not depend on light polarization. Moreover, Rdt of SiNWs prepared on Si(111) can be modeled as an ensemble of diffuse reflectors. For samples prepared on Si(100) wIRd increases with θ, being greater when the light electric field is parallel to the plane of incidence. Also, Rd spectra show structures due to interference effects. For these reasons SiNWs prepared on Si(100) can be considered as a thin film whose refractive index depends on light polarization.


1985 ◽  
Vol 68 (6) ◽  
pp. 38-47
Author(s):  
Yasuaki Kido ◽  
Kazuhito Furuya ◽  
Yasuharu Suematsu

Author(s):  
Julien Fatome ◽  
Stephane Pitois ◽  
Philippe Morin ◽  
Christophe Finot ◽  
Guy Millot

Sign in / Sign up

Export Citation Format

Share Document