scholarly journals Measurement of the Auger Recombination Rate in p-type 0.54-eV GaInAsSb by Time-Resolved Photoluminescence

2003 ◽  
Author(s):  
S. Anikeev ◽  
D. Donetsky ◽  
G. Belenky ◽  
S. Luryi ◽  
C.A. Wang ◽  
...  

2003 ◽  
Vol 83 (16) ◽  
pp. 3317-3319 ◽  
Author(s):  
S. Anikeev ◽  
D. Donetsky ◽  
G. Belenky ◽  
S. Luryi ◽  
C. A. Wang ◽  
...  




1996 ◽  
Vol 35 (Part 1, No. 6A) ◽  
pp. 3642-3647 ◽  
Author(s):  
Takayuki Tanaka ◽  
Akira Harata ◽  
Tsuguo Sawada


1982 ◽  
Vol 18 (19) ◽  
pp. 806 ◽  
Author(s):  
M.G. Burt


Author(s):  
F. Shahedipour ◽  
B.W. Wessels

The decay dynamics of the 2.8 eV emission band in p-type GaN was investigated using time-resolved photoluminescence spectroscopy. The luminescence intensity decays non-exponentially. The decay dynamics were consistent with donor-acceptor pair recombination for a random distribution of pair distances. Calculations using the Thomas-Hopfield model indicated that recombination involves deep donors and shallow acceptors.



Nano Letters ◽  
2017 ◽  
Vol 17 (11) ◽  
pp. 6900-6906 ◽  
Author(s):  
Matthew Pelton ◽  
Jordan J. Andrews ◽  
Igor Fedin ◽  
Dmitri V. Talapin ◽  
Haixu Leng ◽  
...  


1997 ◽  
Vol 486 ◽  
Author(s):  
J. Linnros ◽  
A. Galeckas ◽  
A. Pareaud ◽  
N. Lalic ◽  
V. Grivickas ◽  
...  

AbstractTime resolved photoluminescence (PL) decays have been measured for Si nanocrystals embedded in silicon dioxide. The nanocrystals were formed by Si implantation followed by thermal annealing at 800 – 1200 °C. The observed PL peaked in the wavelength range 640 – 850 nm and the PL decay exhibited a stretched exponential lineshape, characterized by a relatively large time constant. A nonlinear dose dependence of the PL yield and an observed redshifting for increasing doses and/or higher annealing temperatures is discussed in terms of a nucleation and growth mechanism for the nanocrystals. Finally, we argue that Auger recombination is effective at high excitation densities explaining a wavelength dependent saturation of the PL intensity.



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