THE ASSESSMENT OF THE RELIABILITY OF ELECTRONIC COMPONENTS OF FOREIGN PRODUCTION ON THE RESULTS OF TESTS OF SMALL SAMPLES

Within the framework of this article the question of reliability evaluation of electronic component base of foreign production, used as a part of electronic equipment of spacecrafts is considered. The reliability of electronic equipment of spacecrafts directly depends on the reliability of the electronic component base used as a component of it. This electronic component base should provide strict requirements for the active shelf life of the spacecrafts. To date, the requirements for gamma-percentile time to failure of electronic components used as a part of electronic equipment of spacecrafts, reaching 150,000 hours under standard value of у = 95%. Confirmation of such requirements is possible only in case of testing large samples for a long time, which entails considerable economic costs. This inevitably leads to the need to use and develop new ideas and methods of the theory of reliability. In this article, to confirm the reliability requirements for the electronic component base, it is proposed to generalize the estimated score and the data obtained from the results of accelerated tests for reliability, on the basis of the Bayesian theorem. In the result of the investigation was determined by the values of the failure rate of electronic components, as well as the possibility of increasing the value of probability of no failure operation у to a value of 99%, while maintaining the requirements of the gamma-percentile time to failure of electronic components base used as a part of electronic equipment of spacecrafts.