Measurement of strain and electrostatic fields at high spatial resolution on a fast CCD detector with precession electron diffraction

ABSTRACTThe addition of a Gatan imaging parallel electron-energy loss spectrometer (IPEELS) to a Hitachi HF 2000 cold field emission TEM has allowed us to produce high quality energy-filtered coherent electron diffraction patterns and electron holograms from a wide variety of materials. In this paper we review the recent achievements and make an assessment of the use of coherent electron diffraction in solving problems at high spatial resolution in materials science.

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High-resolution scanning precession electron diffraction: Alignment and spatial resolution

Ultramicroscopy ◽

10.1016/j.ultramic.2016.12.018 ◽

2017 ◽

Vol 174 ◽

pp. 79-88 ◽

Cited By ~ 17

Author(s):

Jonathan S. Barnard ◽

Duncan N. Johnstone ◽

Paul A. Midgley

Keyword(s):

High Resolution ◽

Electron Diffraction ◽

Spatial Resolution ◽

Precession Electron Diffraction

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High-precision deformation mapping in finFET transistors with two nanometre spatial resolution by precession electron diffraction

Applied Physics Letters ◽

10.1063/1.4983124 ◽

2017 ◽

Vol 110 (22) ◽

pp. 223109 ◽

Cited By ~ 6

Author(s):

David Cooper ◽

Nicolas Bernier ◽

Jean-Luc Rouvière ◽

Yun-Yu Wang ◽

Weihao Weng ◽

...

Keyword(s):

Electron Diffraction ◽

High Precision ◽

Spatial Resolution ◽

Precession Electron Diffraction

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Using Electron Diffraction Techniques, CBED and N-PED to measure Strain with High Precision and High Spatial Resolution

Microscopy and Microanalysis ◽

10.1017/s1431927615011824 ◽

2015 ◽

Vol 21 (S3) ◽

pp. 2209-2210 ◽

Cited By ~ 1

Author(s):

J.L. Rouviere ◽

Y. Martin ◽

N. Bernier ◽

M. Vigouroux ◽

D. Cooper ◽

...

Keyword(s):

Electron Diffraction ◽

High Precision ◽

Spatial Resolution ◽

High Spatial Resolution

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High spatial resolution AEM observations of yttrium segregation in chromia scales grown on Co-45%Cr

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100144103 ◽

1986 ◽

Vol 44 ◽

pp. 518-519

Author(s):

K. Przybylski ◽

A. J. Garratt-Reed ◽

G. J. Yurek

Keyword(s):

Spatial Resolution ◽

Outer Surface ◽

Maximum Concentration ◽

High Spatial Resolution ◽

Reactive Elements ◽

Chromia Scales

The addition of so-called “reactive” elements such as yttrium to alloys is known to enhance the protective nature of Cr2O3 or Al2O3 scales. However, the mechanism by which this enhancement is achieved remains unclear. An A.E.M. study has been performed of scales grown at 1000°C for 25 hr. in pure O2 on Co-45%Cr implanted at 70 keV with 2x1016 atoms/cm2 of yttrium. In the unoxidized alloys it was calculated that the maximum concentration of Y was 13.9 wt% at a depth of about 17 nm. SIMS results showed that in the scale the yttrium remained near the outer surface.

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Integration of Core-Edge Spectroscopy Methods for the Study of Polymers

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010016323x ◽

1996 ◽

Vol 54 ◽

pp. 154-155

Author(s):

E. G. Rightor

Keyword(s):

Excited State ◽

Polymer Blends ◽

Gas Phase ◽

Spatial Resolution ◽

High Spatial Resolution ◽

Electronic States ◽

Core Electron ◽

Bulk Solids ◽

Development Application

Core edge spectroscopy methods are versatile tools for investigating a wide variety of materials. They can be used to probe the electronic states of materials in bulk solids, on surfaces, or in the gas phase. This family of methods involves promoting an inner shell (core) electron to an excited state and recording either the primary excitation or secondary decay of the excited state. The techniques are complimentary and have different strengths and limitations for studying challenging aspects of materials. The need to identify components in polymers or polymer blends at high spatial resolution has driven development, application, and integration of results from several of these methods.

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