Repair of Sublethal Damage and Oxygen Enhancement Ratio for Low-Voltage Electron Beam Irradiation

1974 ◽  
Vol 60 (2) ◽  
pp. 355 ◽  
Author(s):  
William T. Tobleman ◽  
Arthur Cole
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Low Voltage ◽  
Enhancement Ratio ◽  
Beam Irradiation ◽  
Voltage Electron ◽  
Oxygen Enhancement Ratio ◽  
Oxygen Enhancement

DNA Scission in Hamster Cells and Isolated Nuclei Studied by Low-Voltage Electron Beam Irradiation

1974 ◽  
Vol 60 (1) ◽  
pp. 1 ◽  
Author(s):  
Arthur Cole ◽  
W. Grant Cooper ◽  
Francis Shonka ◽  
Peter M. Corry ◽  
R. M. Humphrey ◽  
...  
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Low Voltage ◽  
Beam Irradiation ◽  
Isolated Nuclei ◽  
Voltage Electron ◽  
Dna Scission

scholarly journals An Aluminum/Polycarbonate (Al/PC) Joint by Homogeneous Low Voltage Electron Beam Irradiation (HLEBI) to PC Prior to Lamination Assembly and Hot-Press

2016 ◽  
Vol 57 (10) ◽  
pp. 1759-1765 ◽  
Author(s):  
Masataka Tomizawa ◽  
Chisato Kubo ◽  
Masae Kanda ◽  
Michael C. Faudree ◽  
Itaru Jimbo ◽  
...  
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Low Voltage ◽  
Hot Press ◽  
Beam Irradiation ◽  
Voltage Electron

scholarly journals Adhesive Resistance to Peeling Force of PTFE/PDMS Laminated Sheet Assisted by Homogeneous Low Voltage Electron Beam Irradiation at 77 K

2014 ◽  
Vol 55 (11) ◽  
pp. 1742-1749 ◽  
Author(s):  
Chisato Kubo ◽  
Takumi Okada ◽  
Masato Uyama ◽  
Masae Kanda ◽  
Yoshitake Nishi
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Low Voltage ◽  
Beam Irradiation ◽  
Voltage Electron

Methods to Monitor and Improve the Performance of Specimen Holders for Transmission Electron Cryomicroscopy

1996 ◽  
Vol 54 ◽  
pp. 454-455
Author(s):  
B. L. Armbruster ◽  
B. Kraus ◽  
M. Pan
Keyword(s):  
Electron Microscopy ◽  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Beam Irradiation ◽  
Quality Of Data ◽  
Electron Cryomicroscopy ◽  
Thermal Equilibration ◽  
Transmission Electron ◽  
Electron Microscopes

One goal in electron microscopy of biological specimens is to improve the quality of data to equal the resolution capabilities of modem transmission electron microscopes. Radiation damage and beam- induced movement caused by charging of the sample, low image contrast at high resolution, and sensitivity to external vibration and drift in side entry specimen holders limit the effective resolution one can achieve. Several methods have been developed to address these limitations: cryomethods are widely employed to preserve and stabilize specimens against some of the adverse effects of the vacuum and electron beam irradiation, spot-scan imaging reduces charging and associated beam-induced movement, and energy-filtered imaging removes the “fog” caused by inelastic scattering of electrons which is particularly pronounced in thick specimens.Although most cryoholders can easily achieve a 3.4Å resolution specification, information perpendicular to the goniometer axis may be degraded due to vibration. Absolute drift after mechanical and thermal equilibration as well as drift after movement of a holder may cause loss of resolution in any direction.

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