scholarly journals Microstructural Evaluation of Nd-Fe-B Strip Cast Alloys

2009 ◽  
Vol 50 (3) ◽  
pp. 479-482 ◽  
Author(s):  
Takashi Hattori ◽  
Nana Fukamachi ◽  
Ryota Goto ◽  
Nobuki Tezuka ◽  
Satoshi Sugimoto
2002 ◽  
Vol 49 (12) ◽  
pp. 1094-1097
Author(s):  
Koichiro Morimoto ◽  
Kenichi Kato ◽  
Kazunori Igarashi ◽  
Ryoji Nakayama

2020 ◽  
Vol 20 (5) ◽  
pp. 3119-3130 ◽  
Author(s):  
Bin Ma ◽  
Xiaoqian Bao ◽  
Aizhi Sun ◽  
Jiheng Li ◽  
Shuai Cao ◽  
...  

1992 ◽  
Vol 7 (12) ◽  
pp. 3235-3241 ◽  
Author(s):  
Y.F. Cheng ◽  
V. Hansen ◽  
J. Gj⊘nnes ◽  
L. Reine Wallenberg

The precipitation behavior, especially the early nucleation stages, of the industrial strip-cast Al3003 alloys was investigated by using transmission electron microscopy (TEM). An icosahedral quasicrystalline phase was found as secondary particles in these strip-cast alloys after heat treatment for a few seconds. Three different nucleation paths are proposed based on the TEM observations. They have the same origin, viz. (Mn, Fe)-containing Mackay icosahedra, and are governed by the composition of alloys, especially the Mn and Si content.


2021 ◽  
Vol 518 ◽  
pp. 167416
Author(s):  
D.A. Kolodkin ◽  
A.G. Popov ◽  
A.V. Protasov ◽  
V.S. Gaviko ◽  
D.Yu. Vasilenko ◽  
...  

2004 ◽  
Vol 366 (1-2) ◽  
pp. 274-278 ◽  
Author(s):  
K. Morimoto ◽  
K. Kato ◽  
K. Igarashi ◽  
R. Nakayama

2013 ◽  
Vol 581 ◽  
pp. 39-47 ◽  
Author(s):  
Shokoufeh Malekjani ◽  
Ilana. B. Timokhina ◽  
Jiangting Wang ◽  
Peter D. Hodgson ◽  
Nicole E. Stanford

Author(s):  
K. B. Alexander ◽  
P. F. Becher

The presence of interfacial films at the whisker-matrix interface can significantly influence the fracture toughness of ceramic composites. The film may alter the interface debonding process though changes in either the interfacial fracture energy or the residual stress at the interface. In addition, the films may affect the whisker pullout process through the frictional sliding coefficients or the extent of mechanical interlocking of the interface due to the whisker surface topography.Composites containing ACMC silicon carbide whiskers (SiCw) which had been coated with 5-10 nm of carbon and Tokai whiskers coated with 2 nm of carbon have been examined. High resolution electron microscopy (HREM) images of the interface were obtained with a JEOL 4000EX electron microscope. The whisker geometry used for HREM imaging is described in Reference 2. High spatial resolution (< 2-nm-diameter probe) parallel-collection electron energy loss spectroscopy (PEELS) measurements were obtained with a Philips EM400T/FEG microscope equipped with a Gatan Model 666 spectrometer.


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