Rapid thickness and optoelectronic properties characterization of few-layer 2D materials based on hyperspectral microscopy
2017 ◽
Vol 20
(sup1)
◽
pp. S201-S202
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2005 ◽
Vol 389
(1-2)
◽
pp. 299-305
◽
2004 ◽
Vol 177
(7)
◽
pp. 2323-2328
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