Research on capsule surface defects inspection algorithms based on colored image

Author(s):  
Zhengtao Zhu ◽  
Jianshu Zhang ◽  
Shijun Long
IEEE Access ◽  
2020 ◽  
Vol 8 ◽  
pp. 190663-190676
Author(s):  
Yuanhong Qiu ◽  
Lixin Tang ◽  
Bin Li ◽  
Suanlong Niu ◽  
Tongzhi Niu

2017 ◽  
Vol 14 (3) ◽  
pp. 172988141770311 ◽  
Author(s):  
Yunpeng Ma ◽  
Qingwu Li ◽  
Yaqin Zhou ◽  
Feijia He ◽  
Shuya Xi

2007 ◽  
Author(s):  
Jia-hui Cong ◽  
Yun-hui Yan ◽  
Hai-an Zhang ◽  
Jun Li

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