In-Flight Wing Deformation Measurement

Author(s):  
Mitsuru Kurita ◽  
Shunsuke Koike ◽  
Kazuyuki Nakakita ◽  
Kazuya Masui
2021 ◽  
pp. 107161
Author(s):  
Yan Liu ◽  
Zhendong Ge ◽  
Yingtao Yuan ◽  
Xin Su ◽  
Xiang Guo ◽  
...  

Author(s):  
Rie Tagai ◽  
Kazuyuki Nakakita ◽  
Mitsuru Kurita ◽  
Tsutomu Nakajima

1997 ◽  
Author(s):  
H. Stahl ◽  
Kevin Stultz ◽  
H. Stahl ◽  
Kevin Stultz

Author(s):  
Michael Hertl ◽  
Diane Weidmann ◽  
Alex Ngai

Abstract A new approach to reliability improvement and failure analysis on ICs is introduced, involving a specifically developed tool for Topography and Deformation Measurement (TDM) under thermal stress conditions. Applications are presented including delamination risk or bad solderability assessment on BGAs during JEDEC type reflow cycles.


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