The method to use electron beam test data to model space discharge for interface circuit analysis
Keyword(s):
1991 ◽
Vol 14
(3-4)
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pp. 197-205
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1986 ◽
Vol 4
(2)
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pp. 139-157
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1990 ◽
Vol 12
(1-4)
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pp. 121-128
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1998 ◽
Vol 69
(2)
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pp. 697-699
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Keyword(s):
2000 ◽
Vol 51-52
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pp. 715-722
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1996 ◽
Vol 376
(2)
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pp. 163-173
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1992 ◽
Vol 16
(1-4)
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pp. 233-238
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