scholarly journals Application of the method of auxiliary sources to a defect-detection inverse problem of optical diffraction microscopy

2010 ◽  
Vol 5 ◽  
Author(s):  
Mirza Karamehmedovic ◽  
Mads-Peter Soerensen ◽  
Poul-Erik Hansen ◽  
Andrei V. Lavrinenko
Keyword(s):  
Inverse Problem ◽  
Defect Detection ◽  
Optical Diffraction ◽  
Method Of Auxiliary Sources ◽  
Diffraction Microscopy

Critical dimension metrology using optical diffraction microscopy

2005 ◽  
Author(s):  
Niels Agersnap ◽  
Poul-Erik Hansen ◽  
Jan C. Petersen ◽  
Jørgen Garnæs ◽  
Nathalie Destouches ◽  
...  
Keyword(s):  
Critical Dimension ◽  
Optical Diffraction ◽  
Diffraction Microscopy

scholarly journals Monitoring Volumetric Changes in Silicon Thin-Film Anodes through In Situ Optical Diffraction Microscopy

2016 ◽  
Vol 8 (27) ◽  
pp. 17642-17650 ◽  
Author(s):  
Jonathon Duay ◽  
Kjell W. Schroder ◽  
Sankaran Murugesan ◽  
Keith J. Stevenson
Keyword(s):  
Thin Film ◽  
Optical Diffraction ◽  
Silicon Thin Film ◽  
Diffraction Microscopy

Profile characterization using optical diffraction microscopy

2006 ◽  
Author(s):  
P-E. Hansen ◽  
N. Agersnap ◽  
A. Kuhle ◽  
J. Garnaes ◽  
J. C. Petersen
Keyword(s):  
Optical Diffraction ◽  
Diffraction Microscopy

Optical diffraction microscopy in a teaching laboratory

2007 ◽  
Vol 75 (9) ◽  
pp. 827-832 ◽  
Author(s):  
Pierre Thibault ◽  
Ivan C. Rankenburg
Keyword(s):  
Optical Diffraction ◽  
Teaching Laboratory ◽  
Diffraction Microscopy

Light Optical Diffraction Studies of Macromolecular Ultrastructure

1970 ◽  
Vol 28 ◽  
pp. 258-259
Author(s):  
Glen B. Haydon
Keyword(s):  
High Resolution ◽  
Diffraction Analysis ◽  
Diffraction Pattern ◽  
Electron Micrographs ◽  
Optical Diffraction ◽  
Electron Micrograph ◽  
Its Analysis ◽  
Resolution Electron ◽  
Diffraction Patterns

Analysis of light optical diffraction patterns produced by electron micrographs can easily lead to much nonsense. Such diffraction patterns are referred to as optical transforms and are compared with transforms produced by a variety of mathematical manipulations. In the use of light optical diffraction patterns to study periodicities in macromolecular ultrastructures, a number of potential pitfalls have been rediscovered. The limitations apply to the formation of the electron micrograph as well as its analysis.(1) The high resolution electron micrograph is itself a complex diffraction pattern resulting from the specimen, its stain, and its supporting substrate. Cowley and Moodie (Proc. Phys. Soc. B, LXX 497, 1957) demonstrated changing image patterns with changes in focus. Similar defocus images have been subjected to further light optical diffraction analysis.

Recent Applications of High Resolution Electron Microscopy to Crystalline Arrays of Virus Particles

1978 ◽  
Vol 36 (3) ◽  
pp. 470-482 ◽  
Author(s):  
R.W. Horne
Keyword(s):  
Electron Microscopy ◽  
Image Processing ◽  
Analytical Techniques ◽  
Staining Technique ◽  
High Resolution Electron Microscopy ◽  
Optical Diffraction ◽  
Full Potential ◽  
Virus Particles ◽  
Resolution Electron ◽  
Wide Range

The technique of surrounding virus particles with a neutralised electron dense stain was described at the Fourth International Congress on Electron Microscopy, Berlin 1958 (see Home & Brenner, 1960, p. 625). For many years the negative staining technique in one form or another, has been applied to a wide range of biological materials. However, the full potential of the method has only recently been explored following the development and applications of optical diffraction and computer image analytical techniques to electron micrographs (cf. De Hosier & Klug, 1968; Markham 1968; Crowther et al., 1970; Home & Markham, 1973; Klug & Berger, 1974; Crowther & Klug, 1975). These image processing procedures have allowed a more precise and quantitative approach to be made concerning the interpretation, measurement and reconstruction of repeating features in certain biological systems.

Microdensitometer—computer correlation analysis of ultrastructural periodicity

1978 ◽  
Vol 36 (2) ◽  
pp. 32-33
Author(s):  
D.R. Ensor ◽  
C.G. Jensen ◽  
J.A. Fillery ◽  
R.J.K. Baker
Keyword(s):  
Correlation Analysis ◽  
Background Noise ◽  
Computer Control ◽  
Optical Diffraction ◽  
Screw Thread ◽  
Straight Line ◽  
Computer Storage ◽  
Correlation Process ◽  
Electron Microscope Image ◽  
Fixed Beam

Because periodicity is a major indicator of structural organisation numerous methods have been devised to demonstrate periodicity masked by background “noise” in the electron microscope image (e.g. photographic image reinforcement, Markham et al, 1964; optical diffraction techniques, Horne, 1977; McIntosh,1974). Computer correlation analysis of a densitometer tracing provides another means of minimising "noise". The correlation process uncovers periodic information by cancelling random elements. The technique is easily executed, the results are readily interpreted and the computer removes tedium, lends accuracy and assists in impartiality.A scanning densitometer was adapted to allow computer control of the scan and to give direct computer storage of the data. A photographic transparency of the image to be scanned is mounted on a stage coupled directly to an accurate screw thread driven by a stepping motor. The stage is moved so that the fixed beam of the densitometer (which is directed normal to the transparency) traces a straight line along the structure of interest in the image.

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