A structural study of biocompatible magnetic nanofluid with synchrotron radiation-based X-ray scattering techniques

2012 ◽  
Vol 67 (2) ◽  
pp. 186-191 ◽  
Author(s):  
A. V. Shulenina ◽  
M. V. Avdeev ◽  
V. L. Aksenov ◽  
A. A. Veligzhanin ◽  
Ya. V. Zubavichus ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Structural Study ◽  
Magnetic Nanofluid ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Structural study of amorphous In2O3 film by grazing incidence X-ray scattering (GIXS) with synchrotron radiation

2006 ◽  
Vol 496 (1) ◽  
pp. 95-98 ◽  
Author(s):  
Futoshi Utsuno ◽  
Hiroyuki Inoue ◽  
Itaru Yasui ◽  
Yukio Shimane ◽  
Shigekazu Tomai ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Structural Study ◽  
Grazing Incidence ◽  
X Ray ◽  
In2o3 Film ◽  
X Ray Scattering ◽  
Ray Scattering

A structural study of amorphous In2O3–ZnO films by grazing incidence X-ray scattering (GIXS) with synchrotron radiation

2008 ◽  
Vol 516 (17) ◽  
pp. 5818-5821 ◽  
Author(s):  
Futoshi Utsuno ◽  
Hiroyuki Inoue ◽  
Yukio Shimane ◽  
Tadao Shibuya ◽  
Koki Yano ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Structural Study ◽  
Grazing Incidence ◽  
Zno Films ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

scholarly journals Protective Dps–DNA co‐crystallization in stressed cells: an in vitro structural study by small‐angle X‐ray scattering and cryo‐electron tomography

FEBS Letters ◽  
2019 ◽  
Vol 593 (12) ◽  
pp. 1360-1371 ◽  
Author(s):  
Liubov A. Dadinova ◽  
Yurii M. Chesnokov ◽  
Roman A. Kamyshinsky ◽  
Ivan A. Orlov ◽  
Maxim V. Petoukhov ◽  
...  
Keyword(s):  
Structural Study ◽  
Small Angle ◽  
Electron Tomography ◽  
X Ray ◽  
X Ray Scattering ◽  
Cryo Electron Tomography ◽  
Stressed Cells ◽  
Ray Scattering

scholarly journals Precise and nondestructive characterization of a ‘buried’ nanostructure in a polymer thin film using synchrotron radiation ultra-small angle X-ray scattering

2012 ◽  
Vol 45 (3) ◽  
pp. 307-312 ◽  
Author(s):  
Takamichi Shinohara ◽  
Tomoko Shirahase ◽  
Daiki Murakami ◽  
Taiki Hoshino ◽  
Moriya Kikuchi ◽  
...  
Keyword(s):  
Thin Film ◽  
Synchrotron Radiation ◽  
Small Angle ◽  
Polymer Thin Film ◽  
X Ray ◽  
X Ray Scattering ◽  
Nondestructive Characterization ◽  
Ray Scattering

Diffuse x-ray scattering from InGaAs/GaAs quantum dots

2003 ◽  
Vol 799 ◽  
Author(s):  
Rolf Köhler ◽  
Daniil Grigoriev ◽  
Michael Hanke ◽  
Martin Schmidbauer ◽  
Peter Schäfer ◽  
...  
Keyword(s):  
Quantum Dots ◽  
Synchrotron Radiation ◽  
Diffuse Scattering ◽  
Data Evaluation ◽  
X Ray ◽  
X Ray Scattering ◽  
Gaas Matrix ◽  
Wetting Layers ◽  
Ray Scattering

ABSTRACTMulti-fold stacks of In0.6Ga0.4As quantum dots embedded into a GaAs matrix were investigated by means of x-ray diffuse scattering. The measurements were done with synchrotron radiation using different diffraction geometries. Data evaluation was based on comparison with simulated distributions of x-ray diffuse scattering. For the samples under consideration ((001) surface) there is no difference in dot extension along [110] and [-110] and no directional ordering. The measurements easily allow the determination of the average indium amount in the wetting layers. Data evaluation by simulation of x-ray diffuse scattering gives an increase of Incontent from the dot bottom to the dot top.

Sign in / Sign up

Export Citation Format

Share Document