Structural study of amorphous In2O3 film by grazing incidence X-ray scattering (GIXS) with synchrotron radiation

2006 ◽  
Vol 496 (1) ◽  
pp. 95-98 ◽  
Author(s):  
Futoshi Utsuno ◽  
Hiroyuki Inoue ◽  
Itaru Yasui ◽  
Yukio Shimane ◽  
Shigekazu Tomai ◽  
...  
2008 ◽  
Vol 516 (17) ◽  
pp. 5818-5821 ◽  
Author(s):  
Futoshi Utsuno ◽  
Hiroyuki Inoue ◽  
Yukio Shimane ◽  
Tadao Shibuya ◽  
Koki Yano ◽  
...  

2020 ◽  
Vol 11 (28) ◽  
pp. 4630-4638 ◽  
Author(s):  
Li Xiang ◽  
Wonyeong Ryu ◽  
Jehan Kim ◽  
Moonhor Ree

Quantitative grazing incidence X-ray scattering analysis combined with X-ray reflectivity using synchrotron radiation sources was explored for the first time cyclic topology effects on the nanoscale film morphology of poly(ε-caprolactone).


1999 ◽  
Vol 18 (1-2) ◽  
pp. 99-107 ◽  
Author(s):  
Shigeo Sato, ◽  
Ryoji Kakiuchi, ◽  
Masato Yoshiya, ◽  
Eiichiro Matsubara, ◽  
Masatoshi Saito, ◽  
...  

2005 ◽  
Vol 472 (1-2) ◽  
pp. 323-327 ◽  
Author(s):  
C.-H. Hsu ◽  
U-Ser Jeng ◽  
Hsin-Yi Lee ◽  
Chih-Mon Huang ◽  
K.S. Liang ◽  
...  

2012 ◽  
Vol 67 (2) ◽  
pp. 186-191 ◽  
Author(s):  
A. V. Shulenina ◽  
M. V. Avdeev ◽  
V. L. Aksenov ◽  
A. A. Veligzhanin ◽  
Ya. V. Zubavichus ◽  
...  

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