Deterministic dynamic element matching: an enabling technology for SoC built-in-self-test

Mapping Intimacies ◽

10.31274/rtd-180813-15384 ◽

2005 ◽

Author(s):

Hanjun Jiang

Keyword(s):

Enabling Technology ◽

Dynamic Element Matching ◽

Deterministic Dynamic ◽

Self Test ◽

Built In Self Test ◽

Dynamic Element

Download Full-text

Precise linear signal generation with nonideal components and deterministic dynamic element matching

10.31274/rtd-20200716-96 ◽

2003 ◽

Author(s):

Beatriz Olleta

Keyword(s):

Signal Generation ◽

Dynamic Element Matching ◽

Deterministic Dynamic ◽

Linear Signal ◽

Dynamic Element

Download Full-text

A Segmented Thermometer Coded DAC with Deterministic Dynamic Element Matching for High Resolution ADC Test

2005 IEEE International Symposium on Circuits and Systems ◽

10.1109/iscas.2005.1464705 ◽

2005 ◽

Author(s):

Hanjun Jiang ◽

B. Olleta ◽

Degang Chen ◽

R.L. Geiger

Keyword(s):

High Resolution ◽

Dynamic Element Matching ◽

Deterministic Dynamic ◽

Adc Test ◽

Dynamic Element

Download Full-text

A deterministic dynamic element matching approach to ADC testing

Proceedings of the 2003 International Symposium on Circuits and Systems, 2003. ISCAS '03. ◽

10.1109/iscas.2003.1206341 ◽

2003 ◽

Author(s):

B. Olleta ◽

L. Juffer ◽

Degang Chen ◽

R. Geiger

Keyword(s):

Dynamic Element Matching ◽

Deterministic Dynamic ◽

Dynamic Element ◽

Download Full-text

Dither Incorporated Deterministic Dynamic Element Matching for High Resolution ADC Test Using Extremely Low Resolution DACs

2005 IEEE International Symposium on Circuits and Systems ◽

10.1109/iscas.2005.1465578 ◽

2005 ◽

Author(s):

Hanjun Jiang ◽

Degang Chen ◽

R.L. Geiger

Keyword(s):

High Resolution ◽

Low Resolution ◽

Dynamic Element Matching ◽

Deterministic Dynamic ◽

Adc Test ◽

Dynamic Element

Download Full-text

A Deterministic Dynamic Element Matching Approach for Testing High-Resolution ADCs With Low-Accuracy Excitations

IEEE Transactions on Instrumentation and Measurement ◽

10.1109/tim.2006.873821 ◽

2006 ◽

Vol 55 (3) ◽

pp. 902-915 ◽

Author(s):

B. Olleta ◽

H. Jiang ◽

D. Chen ◽

R.L. Geiger

Keyword(s):

High Resolution ◽

Dynamic Element Matching ◽

Deterministic Dynamic ◽

Dynamic Element

Download Full-text

Parameter optimization of deterministic dynamic element matching DACs for accurate and cost-effective ADC testing

2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No.04CH37512) ◽

10.1109/iscas.2004.1328347 ◽

2004 ◽

Author(s):

Hanjun Jiang ◽

B. Olleta ◽

Degang Chen ◽

R. Geiger

Keyword(s):

Parameter Optimization ◽

Cost Effective ◽

Dynamic Element Matching ◽

Deterministic Dynamic ◽

Dynamic Element ◽

Download Full-text

Testing high resolution ADCs using deterministic dynamic element matching

2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No.04CH37512) ◽

10.1109/iscas.2004.1328346 ◽

2004 ◽

Author(s):

B. Olleta ◽

Hanjun Jiang ◽

Degang Chen ◽

R. Geiger

Keyword(s):

High Resolution ◽

Dynamic Element Matching ◽

Deterministic Dynamic ◽

Dynamic Element

Download Full-text

Test the S27 Benchmark Circuit by Using Built In Self Test and Test Pattern Generation

International Journal of Advanced Research in Electrical Electronics and Instrumentation Engineering ◽

10.15662/ijareeie.2014.0308083 ◽

2014 ◽

Vol 03 (08) ◽

pp. 11487-11495

Author(s):

S. Nagaraju ◽

Ch.N.L. Sujatha ◽

J.S.S. Ramaraju

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Benchmark Circuit ◽

Self Test ◽

Built In Self Test

Download Full-text

A 83-dB SFDR 10-MHz Bandwidth Continuous-Time Delta-Sigma Modulator Employing a One-Element-Shifting Dynamic Element Matching

IEICE Transactions on Electronics ◽

10.1587/transele.e95.c.1017 ◽

2012 ◽

Vol E95.C (6) ◽

pp. 1017-1025

Author(s):

Hong Phuc NINH ◽

Masaya MIYAHARA ◽

Akira MATSUZAWA

Keyword(s):

Continuous Time ◽

Dynamic Element Matching ◽

Delta Sigma Modulator ◽

Delta Sigma ◽

Dynamic Element

Download Full-text

Memory Implementation in a System on Chip with Built-in Self-Test and Recovery Tools

Proceedings of Universities ELECTRONICS ◽

10.24151/1561-5405-2019-24-3-239-247 ◽

2019 ◽

Vol 24 (3) ◽

pp. 239-247

Author(s):

Vladimir G. Ryabtsev ◽

◽

Sergey V. Volobuev ◽

Keyword(s):

System On Chip ◽

Self Test ◽

Built In Self Test ◽

On Chip ◽

Download Full-text