IMPROVING THE OUTPUT CHARACTERISTICS OF PLANETARY HYDRAULIC MACHINES

Author(s):  
А.І. Панченко ◽  
◽  
А.А. Волошина ◽  
І.А. Панченко ◽  
А.І. Засядько ◽  
...  
Author(s):  
A Voloshina ◽  
A Panchenko ◽  
I Panchenko ◽  
O Titova ◽  
A Zasiadko

2018 ◽  
Vol 7 (4.3) ◽  
pp. 1 ◽  
Author(s):  
Anatolii Panchenko ◽  
Angela Voloshina ◽  
Irina Milaeva ◽  
Igor Panchenko ◽  
Olena Titova ◽  
...  

The technology of rotors manufacturing for orbital hydraulic motors causes a certain form error of the gear surface. This leads to oscillations of the diametrical gap between the rotors. Such oscillations have a negative effect on the change in the output characteristics of the orbital motor. The previous studies on the issue consider the interaction between the rotors of orbital hydraulic machines as a gapless (theoretical) connection. The authors do not take into account that between the rotors of the orbital hydraulic motor, there is no rigid kinematic connection. This allows the internal rotor to move randomly within the diametrical gap (self-aligning). The study led to the development of the mathematical models that describe the relationship between the design features of the rotors and the output characteristics of an orbital hydraulic motor. To simulate the oscillation of the diametrical gap, the limiting deviations for the form error of the rotor gear surfaces have been substantiated. Investigations revealed that fluctuations in the form error of the rotor gear surface have a significant effect on the variation of the diametrical gap. The limiting deviations in the form errors of the gear surface manufacturing enabled to eliminate the oscillation of the diametrical gap and to ensure stability of the output characteristics for the orbital hydraulic motor. 


1993 ◽  
Vol 113 (6) ◽  
pp. 753-759 ◽  
Author(s):  
Kuniho Tanaka ◽  
Etsuo Sakoguchi ◽  
Eiji Yamada

2012 ◽  
Vol 132 (9) ◽  
pp. 922-930 ◽  
Author(s):  
Hirofumi Aoki ◽  
Tadashi Fukami ◽  
Kazuo Shima ◽  
Toshihiro Tsuda ◽  
Mitsuhiro Kawamura

Author(s):  
А.І. Панченко ◽  
◽  
А.А. Волошина ◽  
І.А. Панченко ◽  
С.І. Пастушенко ◽  
...  

Author(s):  
Yasunori Goto ◽  
Hiroomi Eguchi ◽  
Masaru Iida

Abstract In the automotive IC using thick-film silicon on insulator (SOI) semiconductor device, if the gettering capability of a SOI wafer is inadequate, electrical characteristics degradation by metal contamination arises and the yield falls. At this time, an automotive IC was made experimentally for evaluation of the gettering capability as one of the purposes. In this IC, one of the output characteristics varied from the standard, therefore failure analysis was performed, which found trace metal elements as one of the causes. By making full use of 3D perspective, it is possible to fabricate a site-specific sample into 0.1 micrometre in thickness without missing a failure point that has very minute quantities of contaminant in a semiconductor device. Using energy dispersive X-ray, it is possible to detect trace metal contamination at levels 1E12 atoms per sq cm. that are conventionally detected only by trace element analysis.


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