Non-Contact Coating Thickness Measurement

Author(s):  
P.E. Chandler ◽  
M.B.C. Quigley ◽  
J.F. Fletcher

Abstract There are many instances of coatings that require a nondestructive and non-contact measure of coating thickness as part of a quality control system. Specifically, this paper reports on experiments carried out on non-contact measurements of MCrAIY and TBC coatings. The system uses an infra red beam from a solid state laser to generate a thermal wave in the coating. When this wave reaches the substrate an interference effect is caused. The modulated input heating produces a modulated output infra red signal from the surface and at a different wavelength from the laser beam. The output signal has a phase difference from the input signal which is related to the coating thickness. As neither the laser nor the detector are in contact with the surface of the coating and the temperature of the coating is raised by only a few degrees this represents a non-contact NDE system. This system has been tested across a range of coating/substrate combinations. In this paper we give examples of MCrAIY and TBC coatings applied to engine components demonstrating that the accuracy of measurement is only limited by the roughness of the coating structure and substrate. The use of this system for on-line measurement during the spraying process is also discussed and results presented.

Sensors ◽  
2021 ◽  
Vol 21 (10) ◽  
pp. 3340
Author(s):  
Adam Jones ◽  
Leshan Uggalla ◽  
Kang Li ◽  
Yuanlong Fan ◽  
Ashley Willow ◽  
...  

Coatings or films are applied to a substrate for several applications, such as waterproofing, corrosion resistance, adhesion performance, cosmetic effects, and optical coatings. When applying a coating to a substrate, it is vital to monitor the coating thickness during the coating process to achieve a product to the desired specification via real time production control. There are several different coating thickness measurement methods that can be used, either in-line or off-line, which can determine the coating thickness relative to the material of the coating and the substrate. In-line coating thickness measurement methods are often very difficult to design and implement due to the nature of the harsh environmental conditions of typical production processes and the speed at which the process is run. This paper addresses the current and novel coating thickness methodologies for application to chromium coatings on a ferro-magnetic steel substrate with their advantages and limitations regarding in-line measurement. The most common in-line coating thickness measurement method utilized within the steel packaging industry is the X-ray Fluorescence (XRF) method, but these systems can become costly when implemented for a wide packaging product and pose health and safety concerns due to its ionizing radiation. As technology advances, nanometer-scale coatings are becoming more common, and here three methods are highlighted, which have been used extensively in other industries (with several variants in their design) which can potentially measure coatings of nanometer thickness in a production line, precisely, safely, and do so in a non-contact and non-destructive manner. These methods are optical reflectometry, ellipsometry and interferometry.


2014 ◽  
Vol 568-570 ◽  
pp. 45-49
Author(s):  
Qing Quan Xu ◽  
Gong Chen ◽  
Xi Fang Zhu ◽  
An Cheng Xu ◽  
Hui Yang

Lithium battery coating thickness is measured by sensor using laser triangulation. The algorithm based on threshold judgment and multi-scale wavelet is realized for noise high-frequency reduction of lithium battery film thickness systems. The result shows that compared with the unique multi-scale wavelet de-noising, the method applies to different lengths and discontinuous of coating thickness measurement. .


Author(s):  
John F. Mansfield ◽  
Douglas C. Crawford

A method has been developed that allows on-line measurement of the thickness of crystalline materials in the analytical electron microscope. Two-beam convergent beam electron diffraction (CBED) patterns are digitized from a JEOL 2000FX electron microscope into an Apple Macintosh II microcomputer via a Gatan #673 CCD Video Camera and an Imaging Systems Technology Video 1000 frame-capture board. It is necessary to know the lattice parameters of the sample since measurements are made of the spacing of the diffraction discs in order to calibrate the pattern. The sample thickness is calculated from measurements of the spacings of the fringes that are seen in the diffraction discs. This technique was pioneered by Kelly et al, who used the two-beam dynamic theory of MacGillavry relate the deviation parameter (Si) of the ith fringe from the exact Bragg condition to the specimen thickness (t) with the equation:Where ξg, is the extinction distance for that reflection and ni is an integer.


1991 ◽  
Vol 34 (11) ◽  
pp. 1103-1106
Author(s):  
L. S. Babadzhanov

2019 ◽  
Vol 572 ◽  
pp. 118766 ◽  
Author(s):  
Matthias Wolfgang ◽  
Anna Peter ◽  
Patrick Wahl ◽  
Daniel Markl ◽  
J. Axel Zeitler ◽  
...  

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