scholarly journals Second order Lyapunov exponents for parabolic and hyperbolic Anderson models

Bernoulli ◽  
2019 ◽  
Vol 25 (4A) ◽  
pp. 3069-3089
Author(s):  
Raluca M. Balan ◽  
Jian Song
Keyword(s):  
Lyapunov Exponents ◽  
Second Order ◽  
Anderson Models

scholarly journals Lyapunov Exponents in Continuum Bernoulli-Anderson Models

2002 ◽  
pp. 121-130 ◽  
Author(s):  
David Damanik ◽  
Robert Sims ◽  
Günter Stolz
Keyword(s):  
Lyapunov Exponents ◽  
Anderson Models

On the Lyapunov exponents of a class of second-order discrete time linear systems with bounded perturbations

2013 ◽  
Vol 28 (4) ◽  
pp. 473-483 ◽  
Author(s):  
Adam Czornik ◽  
Aleksander Nawrat ◽  
Michał Niezabitowski
Keyword(s):  
Linear Systems ◽  
Lyapunov Exponents ◽  
Discrete Time ◽  
Second Order ◽  
Bounded Perturbations ◽  
Time Linear

scholarly journals Positive Lyapunov exponents and a Large Deviation Theorem for continuum Anderson models, briefly

2019 ◽  
Vol 277 (9) ◽  
pp. 3179-3186 ◽  
Author(s):  
Valmir Bucaj ◽  
David Damanik ◽  
Jake Fillman ◽  
Vitaly Gerbuz ◽  
Tom VandenBoom ◽  
...  
Keyword(s):  
Lyapunov Exponents ◽  
Large Deviation ◽  
Large Deviation Theorem ◽  
Anderson Models

scholarly journals Lyapunov exponents for unitary Anderson models

2007 ◽  
Vol 48 (4) ◽  
pp. 043301 ◽  
Author(s):  
Eman Hamza ◽  
Günter Stolz
Keyword(s):  
Lyapunov Exponents ◽  
Anderson Models

scholarly journals Lyapunov Exponents and Large Deviations Analysis of Eigenfunctions in Anderson Models on Graphs

2013 ◽  
Vol 1 (3) ◽  
pp. 119-134
Author(s):  
VICTOR CHULAEVSKY
Keyword(s):  
Large Deviations ◽  
Lyapunov Exponents ◽  
Anderson Models

Disappearance Voltage Determinations Using a Convergent Beam

1971 ◽  
Vol 29 ◽  
pp. 184-185
Author(s):  
W. L. Bell
Keyword(s):  
Second Order ◽  
Objective Method ◽  
Uniform Thickness ◽  
Rocking Curve ◽  
Crystal Perfection ◽  
Kikuchi Line ◽  
Central Maximum ◽  
Diffraction Patterns ◽  
Convergent Beam ◽  
Beam Technique

Disappearance voltages for second order reflections can be determined experimentally in a variety of ways. The more subjective methods, such as Kikuchi line disappearance and bend contour imaging, involve comparing a series of diffraction patterns or micrographs taken at intervals throughout the disappearance range and selecting that voltage which gives the strongest disappearance effect. The estimated accuracies of these methods are both to within 10 kV, or about 2-4%, of the true disappearance voltage, which is quite sufficient for using these voltages in further calculations. However, it is the necessity of determining this information by comparisons of exposed plates rather than while operating the microscope that detracts from the immediate usefulness of these methods if there is reason to perform experiments at an unknown disappearance voltage.The convergent beam technique for determining the disappearance voltage has been found to be a highly objective method when it is applicable, i.e. when reasonable crystal perfection exists and an area of uniform thickness can be found. The criterion for determining this voltage is that the central maximum disappear from the rocking curve for the second order spot.

Subsystems of Second Order Arithmetic

2009 ◽  
Author(s):  
Stephen G. Simpson
Keyword(s):  
Second Order ◽  
Second Order Arithmetic ◽  
Order Arithmetic
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