Nanoscale characterization of metal/dielectric/semiconductor interfaces using ballistic electron emission microscopy
1997 ◽
Vol 15
(3)
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pp. 1351-1357
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E. Y. Lee
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S. Bhargava
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M. A. Chin
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V. Narayanamurti
2016 ◽
Vol 3
(1)
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pp. 015001
Kuan Eng Johnson Goh
◽
Simin Wang
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Siew Ting Melissa Tan
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Zheng Zhang
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Hiroyo Kawai
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...
1995 ◽
Vol 253
(4)
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pp. 163-233
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H.-J. Im
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Y. Ding
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J. P. Pelz
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B. Heying
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J. S. Speck
Cedric Troadec
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Kuan Eng Johnson Goh
2001 ◽
Vol 89
(10)
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pp. 5797-5799
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C. V. Reddy
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V. Narayanamurti
1994 ◽
Vol 5
(1)
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pp. 31-40
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Roland Coratger
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François Ajustron
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Jacques Beauvillain
1998 ◽
Vol 80
(11)
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pp. 2433-2436
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D. L. Smith
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E. Y. Lee
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V. Narayanamurti
1999 ◽
Vol 74
(3)
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pp. 478-478
B. Kaczer
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H.-J. Im
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J. P. Pelz
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R. M. Wallace
1997 ◽
Vol 81
(12)
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pp. 7870-7875
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R. Coratger
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C. Girardin
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J. Beauvillain
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I. M. Dharmadasa
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A. P. Samanthilake
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...