scholarly journals Nanoscale characterization of metal/dielectric/semiconductor interfaces using ballistic electron emission microscopy

2012 ◽  
Author(s):  
Hailang Qin
2016 ◽  
Vol 3 (1) ◽  
pp. 015001
Author(s):  
Kuan Eng Johnson Goh ◽  
Simin Wang ◽  
Siew Ting Melissa Tan ◽  
Zheng Zhang ◽  
Hiroyo Kawai ◽  
...  

1997 ◽  
Vol 81 (12) ◽  
pp. 7870-7875 ◽  
Author(s):  
R. Coratger ◽  
C. Girardin ◽  
J. Beauvillain ◽  
I. M. Dharmadasa ◽  
A. P. Samanthilake ◽  
...  

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