Nanoscale characterization of oxidized ultrathin Co-films by ballistic electron emission microscopy

Materials Research Express ◽

10.1088/2053-1591/3/1/015001 ◽

2016 ◽

Vol 3 (1) ◽

pp. 015001

Author(s):

Kuan Eng Johnson Goh ◽

Simin Wang ◽

Siew Ting Melissa Tan ◽

Zheng Zhang ◽

Hiroyo Kawai ◽

...

Keyword(s):

Electron Emission ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Nanoscale Characterization ◽

Emission Microscopy

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Nanoscale characterization of metal/dielectric/semiconductor interfaces using ballistic electron emission microscopy

10.32657/10356/50608 ◽

2012 ◽

Author(s):

Hailang Qin

Keyword(s):

Electron Emission ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Semiconductor Interfaces ◽

Nanoscale Characterization ◽

Emission Microscopy

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Atomic and mesoscopic scale characterization of semiconductor interfaces by ballistic electron emission microscopy

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.580588 ◽

1997 ◽

Vol 15 (3) ◽

pp. 1351-1357 ◽

Author(s):

E. Y. Lee ◽

S. Bhargava ◽

M. A. Chin ◽

V. Narayanamurti

Keyword(s):

Electron Emission ◽

Ballistic Electron Emission Microscopy ◽

Mesoscopic Scale ◽

Ballistic Electron ◽

Semiconductor Interfaces ◽

Emission Microscopy ◽

Scale Characterization

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Characterization of Individual Threading Dislocations in GaN Using Ballistic Electron Emission Microscopy

Physical Review Letters ◽

10.1103/physrevlett.87.106802 ◽

2001 ◽

Vol 87 (10) ◽

Author(s):

H.-J. Im ◽

Y. Ding ◽

J. P. Pelz ◽

B. Heying ◽

J. S. Speck

Keyword(s):

Electron Emission ◽

Threading Dislocations ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy

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Characterization of nanopipes/dislocations in silicon carbide using ballistic electron emission microscopy

Journal of Applied Physics ◽

10.1063/1.1365938 ◽

2001 ◽

Vol 89 (10) ◽

pp. 5797-5799 ◽

Author(s):

C. V. Reddy ◽

V. Narayanamurti

Keyword(s):

Silicon Carbide ◽

Electron Emission ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy

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Characterization of the metal-semiconductor interface by ballistic electron emission microscopy

Microscopy Microanalysis Microstructures ◽

10.1051/mmm:019940050103100 ◽

1994 ◽

Vol 5 (1) ◽

pp. 31-40 ◽

Author(s):

Roland Coratger ◽

François Ajustron ◽

Jacques Beauvillain

Keyword(s):

Electron Emission ◽

Ballistic Electron Emission Microscopy ◽

Semiconductor Interface ◽

Ballistic Electron ◽

Emission Microscopy

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Erratum: “Microscopic characterization of hot-electron spreading and trapping in SiO2 films using ballistic electron emission microscopy” [Appl. Phys. Lett. 73, 1871 (1998)]

Applied Physics Letters ◽

10.1063/1.123041 ◽

1999 ◽

Vol 74 (3) ◽

pp. 478-478

Author(s):

B. Kaczer ◽

H.-J. Im ◽

J. P. Pelz ◽

R. M. Wallace

Keyword(s):

Electron Emission ◽

Hot Electron ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy

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Schottky barrier formation at metal/n-ZnSe interfaces and characterization of Au/n-ZnSe by ballistic electron emission microscopy

Journal of Applied Physics ◽

10.1063/1.365395 ◽

1997 ◽

Vol 81 (12) ◽

pp. 7870-7875 ◽

Author(s):

R. Coratger ◽

C. Girardin ◽

J. Beauvillain ◽

I. M. Dharmadasa ◽

A. P. Samanthilake ◽

...

Keyword(s):

Schottky Barrier ◽

Electron Emission ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Barrier Formation ◽

Emission Microscopy

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The Ballistic Electron Emission Microscopy in the Characterization of Quantum Dots

Solid State Phenomena - Nanoscience and Technology ◽

10.4028/3-908451-30-2.529 ◽

2007 ◽

pp. 529-532

Author(s):

S.D. Hutagalung ◽

K.A. Yaacob ◽

Y.C. Keat

Keyword(s):

Quantum Dots ◽

Electron Emission ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy

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Nanometer-Scale Creation and Characterization of Trapped Charge in SiO2Films Using Ballistic Electron Emission Microscopy

Physical Review Letters ◽

10.1103/physrevlett.77.91 ◽

1996 ◽

Vol 77 (1) ◽

pp. 91-94 ◽

Author(s):

B. Kaczer ◽

Z. Meng ◽

J. P. Pelz

Keyword(s):

Electron Emission ◽

Nanometer Scale ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy ◽

Scale Creation ◽

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Microscopic characterization of hot-electron spreading and trapping in SiO2 films using ballistic electron emission microscopy

Applied Physics Letters ◽

10.1063/1.122310 ◽

1998 ◽

Vol 73 (13) ◽

pp. 1871-1873 ◽

Author(s):

B. Kaczer ◽

H.-J. Im ◽

J. P. Pelz ◽

R. M. Wallace

Keyword(s):

Electron Emission ◽

Hot Electron ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy

Download Full-text