Image improvement based on sub-pixel post-integration for a staring imaging system in geostationary orbit

2014 ◽  
Vol 12 (4) ◽  
pp. 042802-42806 ◽  
Author(s):  
Xiaoping Tao Xiaoping Tao ◽  
Feng Yan Feng Yan
2019 ◽  
Vol 58 (7) ◽  
pp. 1691 ◽  
Author(s):  
Hang Yuan ◽  
Xiao-Rui Wang ◽  
Bing-Tao Guo ◽  
Dong Ren ◽  
Wei-Guo Zhang ◽  
...  

2012 ◽  
Vol 41 (11) ◽  
pp. 1359-1364
Author(s):  
陶小平 TAO Xiao-ping ◽  
薛栋林 XUE Dong-lin ◽  
黎发志 LI Fa-zhi ◽  
闫锋 YAN Feng

Author(s):  
J. Jiao ◽  
B. Wang ◽  
C. Wang ◽  
Y. Zhang ◽  
J. Jin ◽  
...  

Diffractive optical imaging technology provides a new way to realize high resolution earth observation on geostationary orbit. There are a lot of benefits to use the membrane-based diffractive optical element in ultra-large aperture optical imaging system, including loose tolerance, light weight, easy folding and unfolding, which make it easy to realize high resolution earth observation on geostationary orbit. The implementation of this technology also faces some challenges, including the configuration of the diffractive primary lens, the development of high diffraction efficiency membrane-based diffractive optical elements, and the correction of the chromatic aberration of the diffractive optical elements. Aiming at the configuration of the diffractive primary lens, the “6+1” petal-type unfold scheme is proposed, which consider the compression ratio, the blocking rate and the development complexity. For high diffraction efficiency membrane-based diffractive optical element, a self-collimating method is proposed. The diffraction efficiency is more than 90 % of the theoretical value. For the chromatic aberration correction problem, an optimization method based on schupmann is proposed to make the imaging spectral bandwidth in visible light band reach 100 nm. The above conclusions have reference significance for the development of ultra-large aperture diffractive optical imaging system.


Author(s):  
Willem H.J. Andersen

Electron microscope design, and particularly the design of the imaging system, has reached a high degree of perfection. Present objective lenses perform up to their theoretical limit, while the whole imaging system, consisting of three or four lenses, provides very wide ranges of magnification and diffraction camera length with virtually no distortion of the image. Evolution of the electron microscope in to a routine research tool in which objects of steadily increasing thickness are investigated, has made it necessary for the designer to pay special attention to the chromatic aberrations of the magnification system (as distinct from the chromatic aberration of the objective lens). These chromatic aberrations cause edge un-sharpness of the image due to electrons which have suffered energy losses in the object.There exist two kinds of chromatic aberration of the magnification system; the chromatic change of magnification, characterized by the coefficient Cm, and the chromatic change of rotation given by Cp.


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