FIXATION LIGHT FOR THE DETERMINATION OF OPTICAL AXIS

A point spread function evaluation method for a microscope on the object plane that is perpendicular to the optical axis is proposed. The measurement of the incident beam direction from the dual position-sensitive-detector (PSD)-based units, the determination of the object plane perpendicularity and the paraxial region, and evaluation methods for the point spread function (PSF) are presented and integrated into the proposed method. The experimental verification demonstrates that the proposed method can achieve a 3D PSF on the perpendicular object plane, as well as magnification, paraxial region evaluation, and confirmation for any microscopic system.

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The image trailer

International Astronomical Union Colloquium ◽

10.1017/s0252921100074261 ◽

1978 ◽

Vol 48 ◽

pp. 311-312

Author(s):

G. D. Gatewood ◽

R. W. Goebel ◽

J. W. Stein

Keyword(s):

Time Resolution ◽

Focal Plane ◽

Optical Axis ◽

Steady Motion ◽

Star Image ◽

Better Than

To further our understanding of the limitations of ground based astrometry and to test the application of electronic centering techniques to the determination of star positions, we have assembled a device which can follow the position of a star as it is trailed across the focal plane of a telescope. A uniform above atmosphere motion is achieved by pointing the instrument slightly ahead of a star image and turning off the telescope’s drive. As the star moves into the acquisition circle of the Image Trailer (IT) the device commences a steady motion at a rate predetermined by the focal plane scale of the 76-cm Thaw photographic refractor, the star’s distance from the optical axis, and the star’s declination. Utilizing a time resolution of better than one millisecond, the IT can follow variations from the predicted rate with a precision of better than 40 milliarcseconds(mas) per second and can track stars fainter than the 16th photographic magnitude.

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Determination of the optical axis in Z-cut uniaxial crystals by a polarization-based method

Technical Physics Letters ◽

10.1134/s1063785016060122 ◽

2016 ◽

Vol 42 (6) ◽

pp. 559-562

Author(s):

V. D. Paranin

Keyword(s):

Optical Axis

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Determination of the direction of the crystal optical axis of ground uniaxial precious stones by means of polarized-light microscope photometry

Journal of Microscopy ◽

10.1111/j.1365-2818.1987.tb01315.x ◽

1987 ◽

Vol 145 (1) ◽

pp. 55-60 ◽

Cited By ~ 2

Author(s):

W. Boguth

Keyword(s):

Light Microscope ◽

Optical Axis ◽

Polarized Light ◽

Precious Stones

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Determination of the optical-axis orientation of a uniaxial crystal by frequency-domain interferometry

Optics Letters ◽

10.1364/ol.22.000931 ◽

1997 ◽

Vol 22 (12) ◽

pp. 931 ◽

Cited By ~ 8

Author(s):

L. Zheng ◽

O. A. Konoplev ◽

D. D. Meyerhofer

Keyword(s):

Frequency Domain ◽

Optical Axis ◽

Uniaxial Crystal ◽

Axis Orientation

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Conoscopic method for determination of main refractive indices and thickness of a uniaxial crystal cut out parallel to its optical axis

Journal of Applied Crystallography ◽

10.1107/s0021889809025709 ◽

2009 ◽

Vol 42 (5) ◽

pp. 878-884 ◽

Cited By ~ 13

Author(s):

Leonas Dumitrascu ◽

Irina Dumitrascu ◽

Dana Ortansa Dorohoi

Keyword(s):

Liquid Crystal ◽

Optical Axis ◽

Ccd Camera ◽

Uniaxial Crystal ◽

Refractive Indices ◽

Anisotropic Layer ◽

Analysis Technique ◽

Planar Orientation ◽

Optical Sign

This paper presents a simplified data acquisition and analysis technique for use in determining the main refractive indices and thickness of a uniaxial anisotropic layer cut out parallel to the optical axis, by processing the conoscopic interference figures obtained using a polarizing microscope equipped with a CCD camera. For negative uniaxial crystals, the equations used permit the calculation of the optical sign of the studied material so it is not necessary to insert a quartz wedge into the conoscopic beam. The technique can also be applied to the study of liquid crystal layers in a planar orientation.

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