A Detailed Numerical Analysis for High-Tc Superconductivity and Physical Analysis of the High-Tc Phase Diagram Based on the U(1) Slave-Boson Approach to the t − J Hamiltonian

2020 ◽  
Vol 76 (11) ◽  
pp. 1020-1024
Author(s):  
Sul-Ah Ahn ◽  
Hyeyoung Cho ◽  
Sung-Ho S. Salk
1991 ◽  
Vol 190 (1-2) ◽  
pp. 18-21 ◽  
Author(s):  
Y. Ikeda ◽  
H. Ito ◽  
S. Shimomura ◽  
Z. Hiroi ◽  
M. Takano ◽  
...  

2017 ◽  
Vol 96 (22) ◽  
Author(s):  
Ivan Kruglov ◽  
Ryosuke Akashi ◽  
Seiji Yoshikawa ◽  
Artem R. Oganov ◽  
M. Mahdi Davari Esfahani

Author(s):  
Shozo Ikeda ◽  
Hirotoshi Hayakawa ◽  
Daniel R. Dietderich

Pb addition makes easier to form the high Tc phase in the BSCCO system. However, Pb easily vaporized at high temperature. A controlled Pb potential method has been applied to grow the high Tc phase in films. Initially, films are deposited on cleaved MgO substrates using an rf magnetron sputtering system. These amorphous as-deposited films are heat treated in a sealed gold capsule along with a large pellet of Pb-added BSCCO. Details of the process and characterization of the films have been reported elsewhere (1). Films trated for 0.5h at 850° C contain mainly the low Tc phase with a small amount of the high Tc phase. Hawever, films treated for 3h at 850°C consist mainly of the high Tc phase. This film is superconductive with a Tc(zero) of 106K. The Pb/Bi ratio of the films, analysed by SEM- EDS, are 0.12 and 0.18 for heat tratment times of 0.5 and 3h, respectively. The present study investigates the modulated structures of these films using HREM.


2018 ◽  
Vol 31 (3) ◽  
pp. 26 ◽  
Author(s):  
Laheeb. A. Mohammed ◽  
Kareem. A. Jasim

   on this research is to study the effect of nickel oxide substitution on the pure phases superconductor Tl0.5Pb0.5Ba2Can-1Cun-xNixO2n+3-δ (n=3) where x=(0,0.2,0.4,0.6,0.8.and 1.0). The specimens in this work were prepared with used  procedure of solid state reaction with sintering temperature 8500C for 24 h .we used technical (4-prob)to calculated and the critical temperature Tc . The results of the XRD diffraction analysis showed that the structure for pure and doped phases was tetragonal with phases high-Tc phase (1223),(1212) and low-Tc phase (1202)  and add to the presence of some impure phase. It was noted the value a=b,c  the parameter of  the lattice increment  with the increment of Ni content. The increment of (NiO) concentration effects electrical resistivity, dielectric constant and the hardness.


1991 ◽  
Vol 185-189 ◽  
pp. 1603-1604
Author(s):  
A.M. Oleś ◽  
J. Zaanen ◽  
P. Horsch

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