Application of High Aspect Ratio Scanning Probe in Microstructure Measurement

2009 ◽  
Vol 69-70 ◽  
pp. 123-127
Author(s):  
M.M. Fu ◽  
K.K. Guo ◽  
Y. Chen ◽  
Y.H. Yang ◽  
Bing Feng Ju
Keyword(s):  
Aspect Ratio ◽  
Single Crystal ◽  
High Aspect Ratio ◽  
Scanning Probe ◽  
Surface Measurement ◽  
Micro Channel ◽  
Pure Tungsten ◽  
Single Crystal Diamond ◽  
Comparison And Analysis ◽  
Diamond Probe

An experiment, which is based on a self-developed pure tungsten high aspect ratio scanning probe, was conducted to measure the topography of a micro channel and a complex microstructure respectively. Comparison and analysis of both results by the tungsten probe and a single-crystal diamond probe were carried out. It indicates that the newly developed pure tungsten scanning probe has the capability in topography measurement, particularly fit for the high aspect ratio surface measurement.

Fabrication of hundreds of microns three-dimensional single crystal diamond channel along with high aspect ratio by two-step process

2019 ◽  
Vol 255 ◽  
pp. 126556
Author(s):  
Jiao Fu ◽  
Yanfeng Wang ◽  
Juan Wang ◽  
Zhangcheng Liu ◽  
Ruozheng Wang ◽  
...  
Keyword(s):  
Aspect Ratio ◽  
Single Crystal ◽  
High Aspect Ratio ◽  
Three Dimensional ◽  
Step Process ◽  
Single Crystal Diamond

High-aspect ratio nanopatterning via combined thermal scanning probe lithography and dry etching

2017 ◽  
Vol 180 ◽  
pp. 20-24 ◽  
Author(s):  
Y. Lisunova ◽  
M. Spieser ◽  
R.D.D. Juttin ◽  
F. Holzner ◽  
J. Brugger
Keyword(s):  
Aspect Ratio ◽  
High Aspect Ratio ◽  
Dry Etching ◽  
Scanning Probe ◽  
Scanning Probe Lithography

scholarly journals (111)-oriented, single crystal diamond tips for nanoscale scanning probe imaging of out-of-plane magnetic fields

2019 ◽  
Vol 115 (19) ◽  
pp. 192401 ◽  
Author(s):  
D. Rohner ◽  
J. Happacher ◽  
P. Reiser ◽  
M. A. Tschudin ◽  
A. Tallaire ◽  
...  
Keyword(s):  
Magnetic Fields ◽  
Single Crystal ◽  
Scanning Probe ◽  
Single Crystal Diamond ◽  
Out Of Plane ◽  
Oriented Single Crystal

High Aspect Ratio Silicon Dioxide-Coated Single-Walled Carbon Nanotube Scanning Probe Nanoelectrodes

2009 ◽  
Vol 113 (16) ◽  
pp. 6815-6820 ◽  
Author(s):  
Yoshie Narui ◽  
Donato M. Ceres ◽  
Jinyu Chen ◽  
Konstantinos P. Giapis ◽  
C. Patrick Collier
Keyword(s):  
Carbon Nanotube ◽  
Aspect Ratio ◽  
Silicon Dioxide ◽  
High Aspect Ratio ◽  
Scanning Probe ◽  
Single Walled Carbon Nanotube ◽  
Single Walled Carbon
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