Ion Beam Mixing in Epitaxial Ag/Fe/Ag-(001)-Layers Investigated with Ferromagnetic Resonance and X-Ray-Diffraction

ABSTRACTMixing effects induced by Kr++ bombardment in the Au-Fe and Pt-Fe metallic systems have been studied by Rutherford backscattering and X-ray diffraction techniques. The mixed amount of Fe atoms shows a linear dependence on the square root of the Kr do se for both systems. The induced mixing appears more efficient for the Pt-Fe with respect to the Au-Fe system. In the case of Pt-Fe mixing is much more efficient when the initial bilayer structure has Pt on the top. The X-ray diffraction analysis reveals the formation of an extended solid solution of Fe in Pt, having the Fe40 Pt60 composition.

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X-ray diffraction studies of ion beam mixing in AuNi superlattices

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/0168-583x(92)95388-8 ◽

1992 ◽

Vol 62 (4) ◽

pp. 541-544 ◽

Cited By ~ 4

Author(s):

Grzegorz Gładyszewski ◽

Andrzej Smal

Keyword(s):

Ion Beam ◽

X Ray Diffraction ◽

Ion Beam Mixing ◽

X Ray

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Study of SHI-induced ion beam mixing in Y3+: YIG employing X-ray diffraction and Mössbauer spectroscopy

Hyperfine Interactions ◽

10.1007/s10751-008-9872-9 ◽

2008 ◽

Vol 187 (1-3) ◽

pp. 117-124 ◽

Cited By ~ 6

Author(s):

P. U. Sharma ◽

M. K. Roy ◽

Ravi Kumar ◽

H. C. Verma ◽

H. H. Joshi ◽

...

Keyword(s):

Mössbauer Spectroscopy ◽

Mossbauer Spectroscopy ◽

Ion Beam ◽

X Ray Diffraction ◽

Ion Beam Mixing ◽

X Ray ◽

Mößbauer Spectroscopy

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Ion‐beam mixing in an Al‐Fe‐Mn system: A conversion‐electron Mössbauer and x‐ray diffraction study

Journal of Applied Physics ◽

10.1063/1.345776 ◽

1990 ◽

Vol 67 (2) ◽

pp. 710-714 ◽

Cited By ~ 1

Author(s):

S. N. Yedave ◽

S. M. Chaudhari ◽

S. M. Kanetkar ◽

S. B. Ogale ◽

S. V. Ghaisas

Keyword(s):

Diffraction Study ◽

Conversion Electron ◽

Ion Beam ◽

X Ray Diffraction ◽

Ion Beam Mixing ◽

X Ray ◽

System A

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Mixing and Demixing of Cu-Mo

MRS Proceedings ◽

10.1557/proc-540-585 ◽

1998 ◽

Vol 540 ◽

Author(s):

L. C. Wei ◽

R. S. Averback

Keyword(s):

Phase Separation ◽

Liquid Nitrogen ◽

Ion Beam ◽

Liquid Nitrogen Temperature ◽

X Ray Diffraction ◽

Maximum Solubility ◽

Ion Beam Mixing ◽

Rich Phase ◽

X Ray ◽

Higher Temperature

AbstractIon beam mixing of Cu/Mo multilayer samples and demixing of Cu-Mo alloy samples were examined as functions of temperature and ion mass. Even at liquid nitrogen temperature, the mixing of one component in other was very small under 1.0 MeV Kr irradiation. The maximum solubility was about 10%. Irradiation of homogeneous Cu-Mo alloys under the same conditions, moreover, led to phase separation. These conclusions were deduced from bulk X-ray diffraction measurements and corroborated by EXAFS examination. The maximum solubility obtained by irradiating multilayer samples occurred at about 600 K. At lower or higher temperature, the solubility of Cu in Mo-rich phase was lower. A model based on the ballistic difflusion explains these results.

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Ion beam mixing of Pd/V superlattices studied by X-ray diffractometry

Surface Science Letters ◽

10.1016/0167-2584(89)90479-9 ◽

1989 ◽

Vol 213 (2-3) ◽

pp. A230

Author(s):

M. StróŻak ◽

P. MikoŁajczak ◽

M. Subotowicz

Keyword(s):

Ion Beam ◽

Ion Beam Mixing ◽

X Ray

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Mev Ion Beam Synthesis of Well-Defined Buried 3C-Sic Layers in Silicon

MRS Proceedings ◽

10.1557/proc-396-877 ◽

1995 ◽

Vol 396 ◽

Cited By ~ 17

Author(s):

J.K.N. Lindner ◽

B. Götz ◽

A. Frohnwieser ◽

B. Stritzker

Keyword(s):

Electron Diffraction ◽

Depth Distribution ◽

Ion Beam ◽

X Ray Diffraction ◽

X Ray ◽

Ion Beam Synthesis ◽

Post Implantation

AbstractWell-defined, homogenous, deep-buried 3C-SiC layers have been formed in silicon by ion beam synthesis using MeV C+ ions. Layers are characterized by RBS/channeling, X-ray diffraction, x-sectional TEM and electron diffraction. The redistribution of implanted carbon atoms into a rectangular carbon depth distribution associated with a well-defined layer during the post-implantation anneal is shown to depend strongly on the existence of crystalline carbide precipitates in the as-implanted state.

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Characterization of Natural and Synthesized FeTiO3 Crystals With RBS/PIXE/XRD

International Journal of PIXE ◽

10.1142/s0129083597000308 ◽

1997 ◽

Vol 07 (03n04) ◽

pp. 265-275

Author(s):

R. Q. Zhang ◽

S. Yamamoto ◽

Z. N. Dai ◽

K. Narumi ◽

A. Miyashita ◽

...

Keyword(s):

Single Crystals ◽

Ion Beam ◽

Pressure Control ◽

Floating Zone ◽

X Ray Diffraction ◽

X Ray ◽

Beam Analysis ◽

Ppm Level

Natural FeTiO 3 (illuminate) and synthesized FeTiO 3, single crystals were characterized by Rutherford backscattering spectroscopy combined with channeling technique and particle-induced x-ray emission (RBS-C and PIXE). The results obtained by the ion beam analysis were supplemented by the x-ray diffraction analysis to identify the crystallographic phase. Oriented single crystals of synthesized FeTiO 3 were grown under the pressure control of CO 2 and H 2 mixture gas using a single-crystal floating zone technique. The crystal quality of synthesized FeTiO 3 single crystals could be improved by the thermal treatment but the exact pressure control is needed to avoid the precipitation of Fe 2 O 3 even during the annealing procedure. Natural FeTiO 3 contains several kinds of impurities such as Mn , Mg , Na and Si . The synthesized samples contain Al , Si and Na which are around 100 ppm level as impurities. The PBS-C results of the natural sample imply that Mn impurities occupy the Fe sublattice in FeTiO 3 or in mixed phase between ilmenite and hematite.

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