Effect of Silane Functional Group on Adhesion of Selected Epoxies for Microelectronic Packaging

2007 ◽  
Vol 4 (1) ◽  
pp. 8-16 ◽  
Author(s):  
M. Jenkins Borrego ◽  
R. H. Dauskardt ◽  
J. C. Bravman

This paper describes experiments designed to evaluate the effect of various silane surface treatments on the thin-film adhesion of epoxies filled with spherical silicon oxide. Fracture mechanics-based methods evaluated adhesion of both filled and unfilled epoxies to silicon oxide. SEM was used to examine fracture surfaces and evaluate fracture mechanisms. Two different epoxies were tested, including one with four components and multiple intermediate cure reactions. It was found that the only silanes that augmented adhesion of the epoxies to silicon oxide were those with functional groups identical to those of the epoxies which take part in the final curing reaction. However, when these silanes were used to coat filler, adhesion of filled epoxies to silicon oxide wafers remained the same or was slightly reduced. In all cases, fracture occurred at or near the epoxy-wafer interface, suggesting that deformation within the epoxy layer was limited. Only one set of specimens, in which the silane was improperly prepared, resulted in augmented epoxy-wafer adhesion facilitated by filler-matrix delamination. In other words, filled epoxy-wafer adhesion increases with decreasing efficacy of silane adhesion promoter treatment.

1991 ◽  
Vol 239 ◽  
Author(s):  
H. S. Jeong ◽  
Y. Z. Chu ◽  
M. B. Freiler ◽  
C. Durning ◽  
R. C. White

ABSTRACTFracture energy (Ga) of BPDA-PDA polyimide (PI) on modified and unmodified Si surfaces was measured by the “blister” test as a function of final cure temperature. It is proven quantitatively that surface modification prior to thin film deposition enhances adhesion. Metal adhesion to PI was also measured by the same method. Reproducibility of the data was found to be exceptionally good for both cases. The linear elastic model is quite valid for the test of thin film adhesion. Therefore, it is believed that this test is best suited for Ga measurements in the study of thin film adhesion for microelectronic packaging.


1997 ◽  
Vol 12 (10) ◽  
pp. 2673-2685 ◽  
Author(s):  
Maarten P. de Boer ◽  
Michael Kriese ◽  
William W. Gerberich

We have investigated mechanical probing of a precracked fine line structure as a new type of thin film fracture mechanics specimen. An idealized mechanics analysis is first presented. Experimentally, two types of precracks are formed. A thin carbon layer to which other layers weakly adhere creates a “processed precrack” by integrated circuit processing techniques. An “indented processed precrack” is formed by precision alignment of a sharp microwedge. The processed precrack is found to reduce the critical tangential load by 50% from a non-precracked line, while the indented processed precrack lowers the load by 200%. From this, a reasonable value of adhesion may be directly calculated. Crack path behavior is observed to depend on strength of the interface. In the case of a weak interface, the crack remains in the interface as it extends. For a strong interface, it kinks into the substrate if the crack is initially short, but remains in the interface if it is initially long. Given the experimental evidence, the mechanics are slightly modified to quantitatively model the experimental data.


Nano Letters ◽  
2021 ◽  
Author(s):  
Jingcheng Ma ◽  
Jin Myung Kim ◽  
Muhammad Jahidul Hoque ◽  
Kamila J. Thompson ◽  
SungWoo Nam ◽  
...  

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