The stylus or scratch method for thin film adhesion measurement: some observations and comments

1970 ◽  
Vol 3 (6) ◽  
pp. 877-883 ◽  
Author(s):  
D W Butler ◽  
C T H Stoddart ◽  
P R Stuart
2006 ◽  
Vol 88 (19) ◽  
pp. 191911 ◽  
Author(s):  
V. Kireev ◽  
Y. Liu ◽  
Y. Braiman ◽  
B. Radhakrishnan ◽  
C. H. Hsueh ◽  
...  

2004 ◽  
Vol 4 (2) ◽  
pp. 163-168 ◽  
Author(s):  
M.J. Cordill ◽  
D.F. Bahr ◽  
N.R. Moody ◽  
W.W. Gerberich

1997 ◽  
Vol 12 (10) ◽  
pp. 2673-2685 ◽  
Author(s):  
Maarten P. de Boer ◽  
Michael Kriese ◽  
William W. Gerberich

We have investigated mechanical probing of a precracked fine line structure as a new type of thin film fracture mechanics specimen. An idealized mechanics analysis is first presented. Experimentally, two types of precracks are formed. A thin carbon layer to which other layers weakly adhere creates a “processed precrack” by integrated circuit processing techniques. An “indented processed precrack” is formed by precision alignment of a sharp microwedge. The processed precrack is found to reduce the critical tangential load by 50% from a non-precracked line, while the indented processed precrack lowers the load by 200%. From this, a reasonable value of adhesion may be directly calculated. Crack path behavior is observed to depend on strength of the interface. In the case of a weak interface, the crack remains in the interface as it extends. For a strong interface, it kinks into the substrate if the crack is initially short, but remains in the interface if it is initially long. Given the experimental evidence, the mechanics are slightly modified to quantitatively model the experimental data.


1991 ◽  
Vol 239 ◽  
Author(s):  
H. S. Jeong ◽  
Y. Z. Chu ◽  
M. B. Freiler ◽  
C. Durning ◽  
R. C. White

ABSTRACTFracture energy (Ga) of BPDA-PDA polyimide (PI) on modified and unmodified Si surfaces was measured by the “blister” test as a function of final cure temperature. It is proven quantitatively that surface modification prior to thin film deposition enhances adhesion. Metal adhesion to PI was also measured by the same method. Reproducibility of the data was found to be exceptionally good for both cases. The linear elastic model is quite valid for the test of thin film adhesion. Therefore, it is believed that this test is best suited for Ga measurements in the study of thin film adhesion for microelectronic packaging.


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