Becker?s Melanosis in Association with Ipsilateral Linear Verrucous Epidermal Nevus and Woolly Hair Nevus-A Coincidence or New Type of Epidermal Naevus Syndrome?

A new type of synthetic industrial diamond formed by an explosive shock process has been recently developed by the Du Pont Company. This material consists of a mixture of two basically different forms, as shown in Figure 1: relatively flat and compact aggregates of acicular crystallites, and single crystals in the form of irregular polyhedra with straight edges.Figure 2 is a high magnification micrograph typical for the fibrous aggregates; it shows that they are composed of bundles of crystallites 0.05-0.3 μ long and 0.02 μ. wide. The selected area diffraction diagram (insert in Figure 2) consists of a weak polycrystalline ring pattern and a strong texture pattern with arc reflections. The latter results from crystals having preferred orientation, which shows that in a given particle most fibrils have a similar orientation.

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New type electron gun with electrostatic and electromagnetic lenses

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100107459 ◽

1978 ◽

Vol 36 (1) ◽

pp. 62-63

Author(s):

T. Ichinokawa ◽

H. Maeda

Keyword(s):

Electron Microscopy ◽

Electron Beam ◽

Optimum Condition ◽

Bias Voltage ◽

Electron Gun ◽

Charge Effect ◽

Micro Fabrication ◽

Maximum Brightness ◽

New Type ◽

The Ideal

I. IntroductionThermionic electron gun with the Wehnelt grid is popularly used in the electron microscopy and electron beam micro-fabrication. It is well known that this gun could get the ideal brightness caluculated from the Lengumier and Richardson equations under the optimum condition. However, the design and ajustment to the optimum condition is not so easy. The gun has following properties with respect to the Wehnelt bias; (1) The maximum brightness is got only in the optimum bias. (2) In the larger bias than the optimum, the brightness decreases with increasing the bias voltage on account of the space charge effect. (3) In the smaller bias than the optimum, the brightness decreases with bias voltage on account of spreading of the cross over spot due to the aberrations of the electrostatic immersion lens.In the present experiment, a new type electron gun with the electrostatic and electromagnetic lens is designed, and its properties are examined experimentally.

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A new type of defect structure in 124-superconducting oxide revealed by HREM

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100089779 ◽

1991 ◽

Vol 49 ◽

pp. 1092-1093

Author(s):

R. Sharma ◽

B.L. Ramakrishna ◽

N.N. Thadhani ◽

D. Hianes ◽

Z. Iqbal

Keyword(s):

Shock Wave ◽

Defect Structure ◽

Neutron Radiation ◽

Weak Links ◽

Defect Structures ◽

New Materials ◽

New Type ◽

Current Densities ◽

Processing Techniques ◽

Microstructural Studies

After materials with superconducting temperatures higher than liquid nitrogen have been prepared, more emphasis has been on increasing the current densities (Jc) of high Tc superconductors than finding new materials with higher transition temperatures. Different processing techniques i.e thin films, shock wave processing, neutron radiation etc. have been applied in order to increase Jc. Microstructural studies of compounds thus prepared have shown either a decrease in gram boundaries that act as weak-links or increase in defect structure that act as flux-pinning centers. We have studied shock wave synthesized Tl-Ba-Cu-O and shock wave processed Y-123 superconductors with somewhat different properties compared to those prepared by solid-state reaction. Here we report the defect structures observed in the shock-processed Y-124 superconductors.

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ESEM - A multipurpose surface Electron Microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100144607 ◽

1986 ◽

Vol 44 ◽

pp. 632-633 ◽

Cited By ~ 2

Author(s):

G.D. Danilatos

Keyword(s):

Electron Microscope ◽

Room Temperature ◽

Environmental Scanning ◽

Gas Composition ◽

Saturated Water Vapor ◽

Surface Electron ◽

Current State ◽

Saturated Water ◽

New Type ◽

Temperature And Pressure

Over recent years a new type of electron microscope - the environmental scanning electron microscope (ESEM) - has been developed for the examination of specimen surfaces in the presence of gases. A detailed series of reports on the system has appeared elsewhere. A review summary of the current state and potential of the system is presented here.The gas composition, temperature and pressure can be varied in the specimen chamber of the ESEM. With air, the pressure can be up to one atmosphere (about 1000 mbar). Environments with fully saturated water vapor only at room temperature (20-30 mbar) can be easily maintained whilst liquid water or other solutions, together with uncoated specimens, can be imaged routinely during various applications.

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