Computer analysis of TEM images and diffraction patterns has generally required the use of a video camera and frame storage. However, one can achieve the same result with a simple and inexpensive modification to the JEOL ASD system. With this modification, the ASD unit can collect TEM images and diffraction patterns rastered over the existing STEM detector. This modified ASD system can also use our existing x-ray analysis system (TN-2000) with digital beam control (DBC) to acquire images or diffraction patterns for computer analysis at a resolution of up to 512x512 pixels.Without having a video camera and frame store, one is limited to using STEM for collecting digital images. Scanned TEM allows many more options. Because the specimen is viewed in TEM mode, it is easy to adjust the camera length and magnification and to set up the desired imaging conditions. It is also significantly easier to obtain diffraction patterns using scanned TEM than using STEM methods.
Automatic Computer Analysis of Digital Images of Triple-Antibody-Stained Prostate Biopsies
