Contribution to the printed circuit board defect detection techniques based on fast wavelet transform

2020 ◽  
Author(s):  
Weslei Lopes Sanches
Keyword(s):  
Wavelet Transform ◽  
Defect Detection ◽  
Printed Circuit Board ◽  
Circuit Board ◽  
Fast Wavelet Transform ◽  
Detection Techniques ◽  
Printed Circuit ◽  
Fast Wavelet

Defect detection of printed circuit board based on lightweight deep convolution network

2020 ◽  
Vol 14 (15) ◽  
pp. 3932-3940
Author(s):  
Jiaquan Shen ◽  
Ningzhong Liu ◽  
Han Sun
Keyword(s):  
Defect Detection ◽  
Printed Circuit Board ◽  
Circuit Board ◽  
Printed Circuit ◽  
Deep Convolution Network

Study of Edge Detection of Printed Circuit Board Photoelectric Image Based on Multi-Scale Wavelet Transform

2012 ◽  
Vol 542-543 ◽  
pp. 850-853
Author(s):  
Nao Sheng Qiao ◽  
Jing Tang
Keyword(s):  
Wavelet Transform ◽  
Edge Detection ◽  
Basic Principle ◽  
Printed Circuit Board ◽  
Detection Method ◽  
Circuit Board ◽  
Theory Analysis ◽  
Printed Circuit ◽  
Multi Scale ◽  
Edge Detection Method

Aiming at the dark printed circuit board photoelectric image that contains noise acquired by CCD system, the edge detection method by using multi-scale wavelet transform is proposed. Firstly, its basic principle is analyzed in detail, and the simple physics explanation and formula deduction are given. Secondly, the idiographic detection steps are given. Finally, the results of experiment verify the correctness of theory analysis.

scholarly journals Adversarial semi-supervised learning method for printed circuit board unknown defect detection

2020 ◽  
Vol 2020 (13) ◽  
pp. 505-510
Author(s):  
Wei Shi ◽  
Linlin Zhang ◽  
Yihui Li ◽  
Hong Liu
Keyword(s):  
Supervised Learning ◽  
Defect Detection ◽  
Printed Circuit Board ◽  
Circuit Board ◽  
Learning Method ◽  
Printed Circuit

scholarly journals Unknown defect detection for printed circuit board based on multi-scale deep similarity measure method

2020 ◽  
Vol 2020 (13) ◽  
pp. 388-393
Author(s):  
Runwei Ding ◽  
Can Zhang ◽  
Qisheng Zhu ◽  
Hong Liu
Keyword(s):  
Similarity Measure ◽  
Defect Detection ◽  
Printed Circuit Board ◽  
Circuit Board ◽  
Printed Circuit ◽  
Multi Scale
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