scholarly journals Characterization of ZnO Nanoparticles Grown by Laser Ablation of a Zn Target in Neat Water

2009 ◽  
Vol 30 (7) ◽  
pp. 1616-1618 ◽  
Keyword(s):  
Laser Ablation ◽  
Zno Nanoparticles ◽  
Neat Water

Formation of ZnO nanoparticles by laser ablation in neat water

2011 ◽  
Vol 511 (1-3) ◽  
pp. 116-120 ◽  
Author(s):  
Kuk Ki Kim ◽  
Daehyun Kim ◽  
Sang Kyu Kim ◽  
Seung Min Park ◽  
Jae Kyu Song
Keyword(s):  
Laser Ablation ◽  
Zno Nanoparticles ◽  
Neat Water

Preparation and characterization of ZnO nanoparticles via laser ablation for sensing NO2 gas

Optik ◽  
2021 ◽  
pp. 167762
Author(s):  
Shahad S. Khudiar ◽  
Uday M. Nayef ◽  
Falah A-H Mutlak
Keyword(s):  
Laser Ablation ◽  
Zno Nanoparticles

Preparation and characterization of colloidal ZnO nanoparticles using nanosecond laser ablation in water

2011 ◽  
Vol 1 (1) ◽  
pp. 45-49 ◽  
Author(s):  
Raid A. Ismail ◽  
Abdulrahman K. Ali ◽  
Mukhlis M. Ismail ◽  
Khaleel I. Hassoon
Keyword(s):  
Laser Ablation ◽  
Zno Nanoparticles ◽  
Nanosecond Laser ◽  
Nanosecond Laser Ablation

Characterization of aluminum, brass and steel nanoparticles after laser ablation

2009 ◽  
Author(s):  
Nancy Van Suetendael ◽  
Kristie Powell ◽  
Susan Earles ◽  
Mary Helen McCay ◽  
Ivica Kostanic
Keyword(s):  
Laser Ablation

Detection and Characterization of an Electrical Failure Induced during Laser Ablation of Packages

2008 ◽  
Author(s):  
P. Schwindenhammer ◽  
H. Murray ◽  
P. Descamps ◽  
P. Poirier
Keyword(s):  
Laser Ablation ◽  
Integrated Circuits ◽  
Failure Analysis ◽  
Ablation Process ◽  
Thermally Induced ◽  
Electrical Failure ◽  
Electrical Phenomenon ◽  
Semiconductor Packages ◽  
Complex Semiconductor

Abstract Decapsulation of complex semiconductor packages for failure analysis is enhanced by laser ablation. If lasers are potentially dangerous for Integrated Circuits (IC) surface they also generate a thermal elevation of the package during the ablation process. During measurement of this temperature it was observed another and unexpected electrical phenomenon in the IC induced by laser. It is demonstrated that this new phenomenon is not thermally induced and occurs under certain ablation conditions.

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