Power Management During Scan Based Sequential Circuit Testing

Advanced Computing An International Journal ◽

10.5121/acij.2011.2302 ◽

2011 ◽

Vol 2 (3) ◽

pp. 9-20

Author(s):

Reshma P ◽

M Geetha Priya

Keyword(s):

Power Management ◽

Sequential Circuit ◽

Circuit Testing

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Scan Based Sequential Circuit Testing Using DFT Advisor

Information Technology and Mobile Communication - Communications in Computer and Information Science ◽

10.1007/978-3-642-20573-6_32 ◽

2011 ◽

pp. 203-206

Author(s):

P. Reshma

Keyword(s):

Sequential Circuit ◽

Circuit Testing

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Application of homing sequences to synchronous sequential circuit testing

IEEE Transactions on Computers ◽

10.1109/12.280804 ◽

1994 ◽

Vol 43 (5) ◽

pp. 569-580 ◽

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Sequential Circuit ◽

Circuit Testing

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Application of homing sequences to synchronous sequential circuit testing

Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS) ATS-93 ◽

10.1109/ats.1993.398825 ◽

2002 ◽

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Sequential Circuit ◽

Circuit Testing

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An efficient approach to low cost sequential circuit testing in a BIST environment

Proceedings Seventh Annual IEEE International ASIC Conference and Exhibit ◽

10.1109/asic.1994.404533 ◽

2002 ◽

Author(s):

C.-I.H. Chen ◽

R.F. O'Bleness ◽

J.T. Yuen ◽

Chia-Lin Chan

Keyword(s):

Low Cost ◽

Sequential Circuit ◽

Circuit Testing ◽

Efficient Approach

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Sequential circuit testing

Digest of Papers Compcon Spring '90. Thirty-Fifth IEEE Computer Society International Conference on Intellectual Leverage ◽

10.1109/cmpcon.1990.63722 ◽

2002 ◽

Author(s):

S. Mourad

Keyword(s):

Sequential Circuit ◽

Circuit Testing

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Test set encoding for efficient sequential circuit testing

IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings ◽

10.1109/imtc.1997.612438 ◽

2002 ◽

Author(s):

V. Iyengar ◽

K. Chakrabarty ◽

B.T. Murray

Keyword(s):

Sequential Circuit ◽

Circuit Testing ◽

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Sequential circuit testing: from DFT to SFT

Proceedings Tenth International Conference on VLSI Design ◽

10.1109/icvd.1997.568089 ◽

2002 ◽

Author(s):

R.M. Chou ◽

K.K. Saluja

Keyword(s):

Sequential Circuit ◽

Circuit Testing

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Power Management for Hospital Combined Distributed Power with Load Prediction Using Deep Learning in Islanded Operation Mode

IEEJ Transactions on Electronics Information and Systems ◽

10.1541/ieejeiss.140.156 ◽

2020 ◽

Vol 140 (2) ◽

pp. 156-163

Author(s):

Yuji Mizuno ◽

Yoshito Tanaka ◽

Fujio Kurokawa ◽

Nobumasa Matsui

Keyword(s):

Deep Learning ◽

Power Management ◽

Operation Mode ◽

Load Prediction ◽

Distributed Power ◽

Islanded Operation

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Prospective Transient Recovery Voltage Measurement of Short Circuit Testing Circuit by Reverse Current Injection

IEEJ Transactions on Power and Energy ◽

10.1541/ieejpes.139.522 ◽

2019 ◽

Vol 139 (8) ◽

pp. 522-526

Author(s):

Kyoya Nonaka ◽

Tadashi Koshizuka ◽

Eiichi Haginomori ◽

Hisatoshi Ikeda ◽

Takeshi Shinkai ◽

...

Keyword(s):

Short Circuit ◽

Reverse Current ◽

Current Injection ◽

Voltage Measurement ◽

Circuit Testing ◽

Transient Recovery Voltage ◽

Recovery Voltage

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A power management and control strategy with grid-ancillary services for a microgrid based on DC Bus

International Review of Electrical Engineering (IREE) ◽

10.15866/iree.v9i4.2038 ◽

2014 ◽

Vol 9 (4) ◽

pp. 792 ◽

Author(s):

Anna Pinnarelli ◽

Giuseppe Barone ◽

Giovanni Brusco ◽

Alessandro Burgio ◽

Daniele Menniti ◽

...

Keyword(s):

Power Management ◽

Control Strategy ◽

Ancillary Services ◽

Dc Bus ◽

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