scholarly journals Characterization of Laser-Induced Defect Sand Modification in Carbon Nanotubes by Raman Spectroscopy

10.5772/52091 ◽  
2013 ◽  
Author(s):  
Masaru Tachibana
Keyword(s):  
Carbon Nanotubes ◽  
Raman Spectroscopy

In Situ Atomic Force Microscopy Tip-Induced Deformations and Raman Spectroscopy Characterization of Single-Wall Carbon Nanotubes

Nano Letters ◽  
2012 ◽  
Vol 12 (8) ◽  
pp. 4110-4116 ◽  
Author(s):  
P. T. Araujo ◽  
N. M. Barbosa Neto ◽  
H. Chacham ◽  
S. S. Carara ◽  
J. S. Soares ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Single Wall Carbon Nanotubes ◽  
Single Wall Carbon ◽  
Force Microscopy ◽  
Atomic Force

Characterization of Bundled and Individual Triple-Walled Carbon Nanotubes by Resonant Raman Spectroscopy

ACS Nano ◽  
2013 ◽  
Vol 7 (3) ◽  
pp. 2381-2387 ◽  
Author(s):  
Thomas Ch. Hirschmann ◽  
Paulo T. Araujo ◽  
Hiroyuki Muramatsu ◽  
Xu Zhang ◽  
Kornelius Nielsch ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Raman Spectroscopy ◽  
Resonant Raman ◽  
Walled Carbon Nanotubes

Characterization of doped single-wall carbon nanotubes by Raman spectroscopy

Carbon ◽  
2011 ◽  
Vol 49 (7) ◽  
pp. 2264-2272 ◽  
Author(s):  
Satoru Suzuki ◽  
Hiroki Hibino
Keyword(s):  
Carbon Nanotubes ◽  
Raman Spectroscopy ◽  
Single Wall Carbon Nanotubes ◽  
Single Wall Carbon

Micromachined Silicon Grids for Direct TEM Characterization of Carbon Nanotubes Grown by CVD

2006 ◽  
Vol 963 ◽  
Author(s):  
Yongho Choi ◽  
Jason Johnson ◽  
Ryan Moreau ◽  
Eric Perozziello ◽  
Ant Ural
Keyword(s):  
Electron Microscopy ◽  
Carbon Nanotubes ◽  
Raman Spectroscopy ◽  
Chemical Vapor ◽  
Silicon Substrates ◽  
Back Side ◽  
Post Processing ◽  
Tem Analysis ◽  
Micro Raman Spectroscopy

ABSTRACTTransmission electron microscopy (TEM) is a key technique in the structural characterization of carbon nanotubes. For device applications, carbon nanotubes are typically grown by chemical vapor deposition (CVD) on silicon substrates. However, TEM requires very thin samples, which are electron transparent. Therefore, for TEM analysis, CVD grown nanotubes are typically deposited on commercial TEM grids by post-processing. This procedure has two problems: It can damage the nanotubes, and it does not work reliably if the nanotube density is too low. The ability to do TEM directly on as-grown nanotubes lying on the silicon substrate would solve these two problems. In this work, for this purpose, we have fabricated micromachined TEM grids from silicon substrates. In particular, we have wet-etched large membranes from the back side of silicon wafers with a thin layer of thermal oxide on them. We have then etched a large array of long and narrow open slits on these membranes from the top side using a deep silicon etcher. Subsequently, we have grown nanotubes on these micromachined TEM grids by CVD, and characterized the nanotubes by high resolution TEM (HRTEM), micro-Raman spectroscopy, scanning electron microscopy (SEM), and atomic force microscopy (AFM). Since the nanotubes grown on the micromachined substrates are completely suspended over the width of the open slits, these substrates form a natural TEM grid for direct imaging of CVD-grown nanotubes. Furthermore, the signal from the substrate is significantly reduced during micro-Raman spectroscopy, resulting in a better signal-to-noise ratio. In addition, the silicon membranes are strong enough to support AFM and SEM characterization. As a result, these substrates provide a low cost, mass producible, efficient, and reliable platform for direct TEM, Raman, AFM, and SEM analysis of as-grown nanotubes or other nanomaterials on the same substrate, eliminating the need for any post-processing after CVD growth.

Characterization of carbon nanotubes suspended between nanostructures using micro-Raman spectroscopy

2004 ◽  
Vol 24 (1-2) ◽  
pp. 26-31 ◽  
Author(s):  
Y Kobayashi ◽  
D Takagi ◽  
Y Ueno ◽  
Y Homma
Keyword(s):  
Carbon Nanotubes ◽  
Raman Spectroscopy ◽  
Micro Raman Spectroscopy

Characterization of Small-Diameter Carbon Nanotubes and Carbon Nanocaps on SiC(000\bar1) Using Raman Spectroscopy

2006 ◽  
Vol 45 (9A) ◽  
pp. 7231-7233 ◽  
Author(s):  
Takahiro Maruyama ◽  
Tomoyuki Shiraiwa ◽  
Naomi Fujita ◽  
Yasuyuki Kawamura ◽  
Shigeya Naritsuka ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Raman Spectroscopy ◽  
Small Diameter

Statistical Raman Spectroscopy: A Method for the Characterization of Covalently Functionalized Single-Walled Carbon Nanotubes

2012 ◽  
Vol 51 (47) ◽  
pp. 11727-11730 ◽  
Author(s):  
Ferdinand Hof ◽  
Sebastian Bosch ◽  
Jan M. Englert ◽  
Frank Hauke ◽  
Andreas Hirsch
Keyword(s):  
Carbon Nanotubes ◽  
Raman Spectroscopy ◽  
Single Walled Carbon Nanotubes ◽  
Single Walled Carbon ◽  
Walled Carbon Nanotubes
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