A novel microstructure for in-situ measurement of residual stress in micromechanical thin films
2007 ◽
Vol 56
(10)
◽
pp. 5691
Yu Yi-Ting
◽
Yuan Wei-Zheng
◽
Qiao Da-Yong
◽
Liang Qing
2003 ◽
Vol 443
(1-2)
◽
pp. 71-77
◽
K.J. Kang
◽
N. Yao
◽
M.Y. He
◽
A.G. Evans
2009 ◽
Vol 19
◽
pp. s243-s249
◽
Jun-Hyub PARK
◽
Dong-Joong KANG
◽
Myung-Soo SHIN
◽
Sung-Jo LIM
◽
Son-Cheol YU
◽
...
2018 ◽
Vol 9
(24)
◽
pp. 7165-7172
◽
Sebastian Volk
◽
Nuri Yazdani
◽
Olesya Yarema
◽
Maksym Yarema
◽
Deniz Bozyigit
◽
...
2019 ◽
Vol 653
◽
pp. 1161-1167
◽
Li Gao
◽
Bo Gao
◽
Dongyu Xu
◽
Ke Sun
2018 ◽
Vol 144
◽
pp. 162-171
◽
Dong-Xing Guan
◽
Ya-Qing Li
◽
Nan-Yang Yu
◽
Guang-Hui Yu
◽
Si Wei
◽
...
1989 ◽
Vol 39
(10)
◽
pp. 979
2018 ◽
Vol 91
(2)
◽
pp. 1344-1352
◽
Hongmei Deng
◽
Mengting Luo
◽
Xinyao Shi
◽
Paul N. Williams
◽
Kexin Li
◽
...
2019 ◽
Vol 2
(4)
◽
pp. 163-168
◽
Mengjie Li
◽
Zaifa Zhou
◽
Liyan Yi
◽
Xijie Wang
◽
Saeed Adnan
2020 ◽
Vol 35
(6)
◽
pp. 644-653
◽
Owen Brazil
◽
Johann P. de Silva
◽
Mithun Chowdhury
◽
Heedong Yoon
◽
Gregory B. McKenna
◽
...