Electronic Structure in Heavy Fermion Compound UPd2Al3 through Directional Compton Profile Measurement

2019 ◽  
Vol 88 (3) ◽  
pp. 034714
Author(s):  
Akihisa Koizumi ◽  
Yasunori Kubo ◽  
Etsuji Yamamoto ◽  
Yoshinori Haga ◽  
Yoshiharu Sakurai
2019 ◽  
Vol 99 (7) ◽  
Author(s):  
H. Pfau ◽  
E. W. Rosenberg ◽  
P. Massat ◽  
B. Moritz ◽  
M. Hashimoto ◽  
...  

2010 ◽  
Vol 459 ◽  
pp. 11-14 ◽  
Author(s):  
Hiroyuki Nishino ◽  
Ryutaro Yamaki ◽  
Masayoshi Itou ◽  
Yoshiharu Sakurai ◽  
Hiroshi Sakurai ◽  
...  

We have measured magnetic Compton profile of Co/Pd thin films sputtered on a substrate for studying the electronic structure. For the first time, a silicon nitride substrate of 100 nm thickness we used in the magnetic Compton scattering experiment. We have improved vacuum tubes of the Compton beam-line BL08W of SPring-8, and have reduced greatly the background scattering for the Compton profile. We have succeeded in measuring magnetic Compton profile of Co (0.8 nm)/Pd (1.6 nm) 400 nm multilayer.


1998 ◽  
Vol 10 (8) ◽  
pp. L119-L126 ◽  
Author(s):  
G Y Guo ◽  
G A Botton ◽  
Y Nishino

1997 ◽  
Vol 200 (1) ◽  
pp. 137-144 ◽  
Author(s):  
R.K. Pandya ◽  
K.B. Joshi ◽  
Rajesh Jain ◽  
B.L. Ahuja ◽  
B.K. Sharma

2006 ◽  
Vol 378-380 ◽  
pp. 70-71 ◽  
Author(s):  
S. Hartmann ◽  
U. Köhler ◽  
N. Oeschler ◽  
S. Paschen ◽  
C. Krellner ◽  
...  

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